19‐1: Invited Paper: Atom Probe Tomography for Understanding OLED Morphology

We have recently demonstrated that atom probe tomography (APT) can be applied to Organic Light Emitting Diode (OLED) materials. APT can measure the mass and position of molecules in a film with sub‐Dalton and sub‐nm resolutions, allowing for morphology measurements of OLED systems. We will discuss t...

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Bibliographic Details
Published in:	SID International Symposium Digest of technical papers Vol. 50; no. 1; pp. 248 - 251
Main Authors:	Zimmerman, Jeramy D., Jaskot, Matthew B., Proudian, Andrew P., Vincent, Galen
Format:	Journal Article
Language:	English
Published:	Campbell Wiley Subscription Services, Inc 01-06-2019 Wiley Blackwell (John Wiley & Sons)
Subjects:	atom probe tomography local electrode atom probe Morphology organic light emitting diode Organic light emitting diodes Position measurement small molecule Tomography
Online Access:	Get full text
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Summary:	We have recently demonstrated that atom probe tomography (APT) can be applied to Organic Light Emitting Diode (OLED) materials. APT can measure the mass and position of molecules in a film with sub‐Dalton and sub‐nm resolutions, allowing for morphology measurements of OLED systems. We will discuss the technique and key results in emissive guest‐host systems.
Bibliography:	USDOE
ISSN:	0097-966X 2168-0159
DOI:	10.1002/sdtp.12902