Aberration correction in epi-fluorescence microscopy using unknown speckle illumination
Diffraction-limited imaging in epi-fluorescence microscopy remains a challenge when sample aberrations are present or when the region of interest rests deep within an inhomogeneous medium. Adaptive optics is an attractive solution, albeit with limited field of view and requiring relatively complicat...
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Published in: | Optics express Vol. 32; no. 21; p. 37658 |
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Main Authors: | , , , , |
Format: | Journal Article |
Language: | English |
Published: |
07-10-2024
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Online Access: | Get full text |
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