A 20kpixels CdTe photon-counting imager using XPAD chip

• Published in: Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Vol. 589; no. 2; pp. 268 - 274
• Main Authors: Basolo, S., Bérar, J.F., Boudet, N., Breugnon, P., Chantepie, B., Clémens, J.C., Delpierre, P., Dinkespiler, B., Hustache, S., Medjoubi, K., Ménouni, M., Morel, C., Pangaud, P., Vigeolas, E.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01-05-2008
• Subjects: CdTe; Hole collection; Photon counting; Pixel detector; XPAD3; Pixel detector; 29.30.Kr; Photon counting; 61.05.Cf; XPAD3; Hole collection; 29.40.Gx; CdTe; 29.40.Wk
• ISSN: 0168-9002; 1872-9576
• DOI: 10.1016/j.nima.2008.02.042

A 20kpixels CdTe sensor has been hybridized on XPAD3S CMOS photon-counting chips, forming a 19,200pixels imaging device. P-type CdTe with rectifying contact has been employed. This sensor works in hole collection mode with a pulse shaping time of about 150ns. Detector construction and operation are described, and first results obtained with 241Am source as well as diffraction images using an X-ray synchrotron beam are presented. Polarization effects are present, but remain at a very manageable level.