Low-temperature scanning laser microscopy of individual filaments extracted from (Bi, Pb)2Sr2Ca2Cu3O10+x tapes

Low-temperature scanning laser microscopy of individual filaments extracted from (Bi, Pb)2Sr2Ca2Cu3O10+x tapes

The method of low-temperature scanning laser microscopy is applied to visualize the resistive state in individual superconducting filaments extracted from (Bi, Pb)2Sr2Ca2Cu3O10+x/Ag tapes. This technique is capable of imaging the distributions of the critical currents over a sample. Using the nonbol...

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Bibliographic Details
Published in:Applied physics letters Vol. 76; no. 18; pp. 2597 - 2599
Main Authors: Sivakov, A. G., Lukashenko, A. V., Abraimov, D., Müller, P., Ustinov, A. V., Leghissa, M.
Format: Journal Article
Language:English
Published: 01-05-2000
Online Access:Get full text
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Summary:The method of low-temperature scanning laser microscopy is applied to visualize the resistive state in individual superconducting filaments extracted from (Bi, Pb)2Sr2Ca2Cu3O10+x/Ag tapes. This technique is capable of imaging the distributions of the critical currents over a sample. Using the nonbolometric response, a spatial resolution of about 1 μm is demonstrated for 10-μm-thick filaments. Some of the resistively visualized grain boundaries between crystallites show Josephson behavior.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.126420