Wire arc defect localization and mathematical characterization by MCTDR reflectometry

• Published in: 2017 IEEE AUTOTESTCON pp. 1 - 6
• Main Authors: Sallem, Soumaya, Olivas, Marc, Vogel, Laurent Sommer, Peltier, Arnaud
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01-09-2017
• Subjects: arc defect; cable diagnosis; Circuit faults; detection; Impedance; localization; Mathematical model; MCTDR; Power cables; Reflection coefficient; Reflectometry; time domain reflectometry; Wires
• ISSN: 1558-4550
• DOI: 10.1109/AUTEST.2017.8080494

This paper demonstrates the feasibility of detecting brief intermittent arcs on wired networks and characterizing them by mathematical modelization. We develop models of reflections generated by arc defects in transmission lines excited by specific test signals, using time-domain reflectometry. Arc fault causes a local modification of the propagation characteristics of the cable. The MCTDR (Multi-carrier Time Domain reflectometry) reflectogram shows the arc as peaks due to impedance change. The location and arc characteristics are automatically calculated and displayed by a computer device. This study provides an accurate assessment of the severity of the arc fault, as the peak amplitude depends heavily on the arc fault impedance, but also on other impedance changes on the cable.