Ultrafast X-ray photoelectron diffraction from free molecules: Simulations of diffraction profiles from transient intermediates in the elimination reaction of C2H4I2

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Bibliographic Details
Published in:Journal of electron spectroscopy and related phenomena Vol. 258; p. 147221
Main Authors: Minemoto, S., Mun, J.H., Teramoto, T., Yagishita, A., Tsuru, S.
Format: Journal Article
Language:English
Published: 01-07-2022
Online Access:Get full text
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Description
ISSN:0368-2048
DOI:10.1016/j.elspec.2022.147221