221 nm far ultraviolet-C AlGaN laser diode with optimized p-AlN electron blocking epilayers

The optical characteristics of far ultraviolet-C (FUV) laser diode (LD), with optimized position of AlN electron blocking layer (EBL), is shown to enhance carrier injection into the multiquantum well region. The carrier behavior mechanism of FUV LDs is illustrated through the simulation results. The...

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Published in:Optical and quantum electronics Vol. 56; no. 12
Main Authors: Shakir, Syeda Wageeha, Usman, Muhammad, Habib, Usman, Ali, Shazma, Bashir, Jamshad, Noor, Zoya
Format: Journal Article
Language:English
Published: New York Springer US 16-11-2024
Springer Nature B.V
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Abstract The optical characteristics of far ultraviolet-C (FUV) laser diode (LD), with optimized position of AlN electron blocking layer (EBL), is shown to enhance carrier injection into the multiquantum well region. The carrier behavior mechanism of FUV LDs is illustrated through the simulation results. The optimization of AlN EBL position, in the p-region of the FUV LD, is studied in this work. FUV LD with p-AlN EBL, between last quantum barrier and p-waveguide, show an improved gain profile and stimulated emission. The optical power of this FUV LD has been found to have increased markedly. All our FUV LDs are emitting far ultraviolet-C emission i.e., 221 nm. To the best of our knowledge, 221 nm AlGaN LDs are hardly reported in the literature. Therefore, we believe our work on 221 nm AlGaN far ultraviolet-C laser diode will open new avenues for the research community.
AbstractList The optical characteristics of far ultraviolet-C (FUV) laser diode (LD), with optimized position of AlN electron blocking layer (EBL), is shown to enhance carrier injection into the multiquantum well region. The carrier behavior mechanism of FUV LDs is illustrated through the simulation results. The optimization of AlN EBL position, in the p-region of the FUV LD, is studied in this work. FUV LD with p-AlN EBL, between last quantum barrier and p-waveguide, show an improved gain profile and stimulated emission. The optical power of this FUV LD has been found to have increased markedly. All our FUV LDs are emitting far ultraviolet-C emission i.e., 221 nm. To the best of our knowledge, 221 nm AlGaN LDs are hardly reported in the literature. Therefore, we believe our work on 221 nm AlGaN far ultraviolet-C laser diode will open new avenues for the research community.
The optical characteristics of far ultraviolet-C (FUV) laser diode (LD), with optimized position of AlN electron blocking layer (EBL), is shown to enhance carrier injection into the multiquantum well region. The carrier behavior mechanism of FUV LDs is illustrated through the simulation results. The optimization of AlN EBL position, in the p-region of the FUV LD, is studied in this work. FUV LD with p-AlN EBL, between last quantum barrier and p-waveguide, show an improved gain profile and stimulated emission. The optical power of this FUV LD has been found to have increased markedly. All our FUV LDs are emitting far ultraviolet-C emission i.e., 221 nm. To the best of our knowledge, 221 nm AlGaN LDs are hardly reported in the literature. Therefore, we believe our work on 221 nm AlGaN far ultraviolet-C laser diode will open new avenues for the research community.
ArticleNumber 1905
Author Bashir, Jamshad
Shakir, Syeda Wageeha
Usman, Muhammad
Noor, Zoya
Habib, Usman
Ali, Shazma
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Issue 12
Keywords Simulations
Recombination rate
Efficiency
Laser diode
Electron blocking layer
Far ultraviolet-C
Gain
AlGaN
Threshold
Language English
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Snippet The optical characteristics of far ultraviolet-C (FUV) laser diode (LD), with optimized position of AlN electron blocking layer (EBL), is shown to enhance...
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SubjectTerms Aluminum gallium nitrides
Aluminum nitride
Carrier injection
Characterization and Evaluation of Materials
Computer Communication Networks
Electrical Engineering
Far ultraviolet radiation
Lasers
Optical Devices
Optical properties
Optics
Photonics
Physics
Physics and Astronomy
Semiconductor lasers
Stimulated emission
Waveguides
Title 221 nm far ultraviolet-C AlGaN laser diode with optimized p-AlN electron blocking epilayers
URI https://link.springer.com/article/10.1007/s11082-024-07788-4
https://www.proquest.com/docview/3129215089
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