Optimized Multiple-Bit-Flip Soft-Errors-Tolerant TCAM using Machine Learning
Soft errors from radiations can change the data in electronic devices especially memory cells such as in TCAMs. The soft errors cause bit-flip errors that makes the data are corrupted in the network. This paper presents a novel machine learning for a multiple-bit-flip-tolerant TCAM that address soft...
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| Published in: | Jurnal nasional teknik elektro Vol. 11; no. 1; pp. 36 - 42 |
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| Main Authors: | , |
| Format: | Journal Article |
| Language: | English |
| Published: |
Universitas Andalas
29-03-2022
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| Online Access: | Get full text |
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