Design of The Kinetic Inductance Detector Based Focal Plane Assembly for The Terahertz Intensity Mapper

We report on the kinetic inductance detector (KID) array focal plane assembly design for the Terahertz Intensity Mapper (TIM). Each of the 2 arrays consists of 4 wafer-sized dies (quadrants), and the overall assembly must satisfy thermal and mechanical requirements, while maintaining high optical ef...

Full description

Saved in:
Bibliographic Details
Main Authors: Liu, L. -J, Janssen, R. M. J, Bradford, C. M, Hailey-Dunsheath, S, Fu, J, Filippini, J. P, Aguirre, J. E, Bracks, J. S, Corso, A. J, Groppi, C, Hoh, J, Keenan, R. P, Lowe, I. N, Marrone, D. P, Mauskopf, P, Nie, R, Redford, J, Trumper, I, Vieira, J. D
Format: Journal Article
Language:English
Published: 24-07-2024
Subjects:
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We report on the kinetic inductance detector (KID) array focal plane assembly design for the Terahertz Intensity Mapper (TIM). Each of the 2 arrays consists of 4 wafer-sized dies (quadrants), and the overall assembly must satisfy thermal and mechanical requirements, while maintaining high optical efficiency and a suitable electromagnetic environment for the KIDs. In particular, our design manages to strictly maintain a 50 $\mathrm{\mu m}$ air gap between the array and the horn block. We have prototyped and are now testing a sub-scale assembly which houses a single quadrant for characterization before integration into the full array. The initial test result shows a $>$95% yield, indicating a good performance of our TIM detector packaging design.
DOI:10.48550/arxiv.2211.09351