Enhanced ferroelectric properties of low-annealed SrBi2(Ta,Nb)2O9 thin films for NvFeRAM applications

Micro-Raman spectroscopy and X-ray diffraction have been used to explore the lattice dynamics of Nb-substituted SrBi2(Ta1-xNbx)2O9 (SBTN) crystalline thin films annealed at low temperature, 700oC. It turned out that SrBi2(Ta1-xNbx)2O9 films consist of fine-grained spherical structures for x=0.1-0.4,...

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Bibliographic Details
Main Authors: Fesenko, O. M, Yaremkevich, A. D, Tsebrienko, T. V, Bydnyk, O. P, Wang, Lei, Semchenko, A. V, Sidski, V. V, Morozovska, A. N
Format: Journal Article
Language:English
Published: 08-12-2021
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