Infrared Spectroscopy for Chemically Specific Sensing in Silicon-Based Microreactors

• Published in: Analytical chemistry (Washington) Vol. 76; no. 21; pp. 6476 - 6483
• Main Authors: Herzig-Marx, Rachel, Queeney, K. T, Jackman, Rebecca J, Schmidt, Martin A, Jensen, Klavs F
• Format: Journal Article
• Language: English
• Published: Washington, DC American Chemical Society 01-11-2004
• Subjects: Analytical chemistry; Chemistry; Exact sciences and technology; Infrared radiation; Reactors; Sensors; Silicon; Spectrometric and optical methods; Spectrum analysis; Hydrolysis; Infrared spectrometry; Catalytic reaction; Fourier transform spectroscopy; Amine; Multiple internal reflection; Glass; Microreactor; Silicon
• ISSN: 0003-2700; 1520-6882
• DOI: 10.1021/ac049265c

Fourier transform infrared (FT-IR) spectroscopy in a multiple internal reflection (MIR) geometry is integrated with silicon-based microreactors to allow detection of a wide range of chemical species while taking advantage of inexpensive batch fabrication techniques applicable to silicon substrates. The microreactors are fabricated in silicon and glass using standard microfabrication and selective etching techniques. The small (∼1 cm side) reactor size provides access to nearly the full mid-IR frequency region with MIR-FT-IR, allowing us to probe both solution-phase and surface-bound chemical transformations. The wide applicability of this approach is demonstrated with two representative test cases:  kinetics of acid-catalyzed ethyl acetate hydrolysis and amidization of surface-tethered amine groups.