Rapid Limit Tests for Metal Impurities in Pharmaceutical Materials by X-ray Fluorescence Spectroscopy Using Wavelet Transform Filtering

We introduce a new method for analysis of X-ray fluorescence (XRF) spectra based on continuous wavelet transform filters, and the method is applied to the determination of toxic metals in pharmaceutical materials using hand-held XRF spectrometers. The method uses the continuous wavelet transform to...

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Bibliographic Details
Published in:	Analytical chemistry (Washington) Vol. 83; no. 3; pp. 1061 - 1068
Main Authors:	Arzhantsev, Sergey, Li, Xiang, Kauffman, John F
Format:	Journal Article
Language:	English
Published:	Washington, DC American Chemical Society 01-02-2011
Subjects:	Analytical chemistry Calibration Chemistry Exact sciences and technology Fluorescence Mass spectrometry Metals, Heavy - analysis Signal to noise ratio Spectrometric and optical methods Spectrometry, X-Ray Emission - instrumentation Spectrometry, X-Ray Emission - methods Studies Time Factors Ultraviolet Rays Wavelet transforms United States > US Trace analysis Filtering Arsenic Impurity Noise Sample Use X ray spectrometry Calibration Laboratory Metal X ray analysis Signal Analysis method Wavelet transformation Filter Detection limit Chromium Lead X ray fluorescence spectrometry Poison Mercury Signal to noise ratio
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