Surface characterization

A review of the literature on surface characterization is presented. The review includes sections on ion spectrometry, electron spectroscopy, proximal probes, optical characterization of surfaces and x-ray techniques.

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Bibliographic Details
Published in:	Analytical chemistry (Washington) Vol. 65; no. 12; pp. 311 - 333
Main Authors:	McGuire, G. E, Ray, M. A, Simko, Steven J, Perkins, F. Keith, Brandow, Susan L, Dobisz, Elizabeth A, Nemanich, R. J, Chourasia, A. R, Chopra, D. R
Format:	Journal Article
Language:	English
Published:	Washington, DC American Chemical Society 15-06-1993
Subjects:	Analytical chemistry Chemistry Electrons Exact sciences and technology General, instrumentation Ions Scientific imaging X-rays Microprobe Semiconductor materials Adsorption X ray spectrometry Ion spectrometry Fullerenes Review Surface analysis Bibliographic review Electron spectrometry Thin film
Online Access:	Get full text
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Description
Summary:	A review of the literature on surface characterization is presented. The review includes sections on ion spectrometry, electron spectroscopy, proximal probes, optical characterization of surfaces and x-ray techniques.
Bibliography:	ark:/67375/TPS-R2H73DK3-W istex:DB8257C4B8523E2793F845A6A0FB7AFB50260E29 ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23
ISSN:	0003-2700 1520-6882
DOI:	10.1021/ac00060a016