Surface Defect Sites Formed on Partially and Fully Dehydrated MgO:  An EPR/ENDOR Study

• Published in: The journal of physical chemistry. B Vol. 103; no. 11; pp. 1944 - 1953
• Main Authors: Murphy, Damien M, Farley, Robert D, Purnell, Ian J, Rowlands, Christopher C, Yacob, Abdul R, Paganini, Maria Cristina, Giamello, Elio
• Format: Journal Article
• Language: English
• Published: American Chemical Society 18-03-1999
• ISSN: 1520-6106; 1520-5207
• DOI: 10.1021/jp984132e

EPR and ENDOR spectroscopy have been used to investigate a variety of trapped electron centers on the surface of polycrystalline MgO. The oxide was dehydrated under vacuum at different temperatures (673−1123 K) and UV irradiated under H2. The dehydration process results in the formation of surface anion vacancies, which subsequently act as excess electron traps (forming color centers). A variety of such color centers have been identified. At high activation temperatures (1123 K), surface FS +(H) color centers (type I) are formed, which have been assigned to an electron trapped by a specific anion vacancy. At slightly lower activation temperatures, a second FS +(H) color center (type II) predominates; this center has been assigned to an electron trapped in a higher coordinated surface vacancy. However, at low activation temperatures such that the oxide surface remains partially hydrated, different types of color centers are present. It is proposed that these centers arise from electron trapping at a surface cation−anion vacancy pair (tentatively assigned as PS - centers). The mechanism by which the latter center is effectively reduced by a single electron is unclear. The distribution and abundance of these different trapped electron centers varies as a function of the dehydration temperature. The results show that the surface of polycrystalline MgO containing a variety of point defects changes dramatically depending on the pretreatment conditions.