Manipulation of the van der Waals Magnet Cr2Ge2Te6 by Spin–Orbit Torques

We report measurements of current-induced thermoelectric and spin–orbit torque effects within devices in which multilayers of the semiconducting two-dimensional van der Waals magnet Cr2Ge2Te6 (CGT) are integrated with Pt and Ta metal overlayers. We show that the magnetic orientation of the CGT can b...

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Published in:Nano letters Vol. 20; no. 10; pp. 7482 - 7488
Main Authors: Gupta, Vishakha, Cham, Thow Min, Stiehl, Gregory M, Bose, Arnab, Mittelstaedt, Joseph A, Kang, Kaifei, Jiang, Shengwei, Mak, Kin Fai, Shan, Jie, Buhrman, Robert A, Ralph, Daniel C
Format: Journal Article
Language:English
Published: United States American Chemical Society 14-10-2020
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Summary:We report measurements of current-induced thermoelectric and spin–orbit torque effects within devices in which multilayers of the semiconducting two-dimensional van der Waals magnet Cr2Ge2Te6 (CGT) are integrated with Pt and Ta metal overlayers. We show that the magnetic orientation of the CGT can be detected accurately either electrically (using an anomalous Hall effect) or optically (using magnetic circular dichroism) with good consistency. The samples exhibit large thermoelectric effects, but nevertheless, the spin–orbit torque can be measured quantitatively using the angle-dependent second harmonic Hall technique. For CGT/Pt, we measure the spin–orbit torque efficiency to be similar to conventional metallic-ferromagnet/Pt devices with the same Pt resistivity. The interfacial transparency for spin currents is therefore similar in both classes of devices. Our results demonstrate the promise of incorporating semiconducting 2D magnets within spin–orbitronic and magneto-thermal devices.
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SC0017671; FA9550-19-1-0390; DMR-1719875; N00014-18-1-2368; ECCS-1542081
National Science Foundation (NSF)
USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division
US Department of the Navy, Office of Naval Research (ONR)
US Air Force Office of Scientific Research (AFOSR)
ISSN:1530-6984
1530-6992
DOI:10.1021/acs.nanolett.0c02965