Wavelength Dependence of the Complex Third-Order Nonlinear Optical Susceptibility of Poly(3-hexylthiophene) Studied by Femtosecond Z‑Scan in Solution and Thin Film

Comprehensive studies of the third-order susceptibility of regioregular poly(3-hexylthiophene) in the wavelength range from 530 to 1600 nm for both thin film (with stacked chains interactions) and dilute solution (no chains interactions) were performed with the Z-scan technique. Negative nonlinear r...

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Bibliographic Details
Published in:	Journal of physical chemistry. C Vol. 117; no. 49; pp. 26197 - 26203
Main Authors:	Szeremeta, Janusz, Kolkowski, Radoslaw, Nyk, Marcin, Samoc, Marek
Format:	Journal Article
Language:	English
Published:	Columbus, OH American Chemical Society 12-12-2013
Subjects:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of specific thin films Physics Red shift Stacking sequence Multi-photon processes Negative refraction Spectral line shift Z scan Nonlinear optical susceptibility Thin films Thiophene derivative polymer Three-photon spectra Two-photon processes Non linear effect Cross sections
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