Characterization of poly(di-n-hexylsilane) in the solid state. I. X-ray and electron diffraction studies

Characterization of poly(di-n-hexylsilane) in the solid state. I. X-ray and electron diffraction studies

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Bibliographic Details
Published in:Macromolecules Vol. 19; no. 10; pp. 2657 - 2660
Main Authors: Lovinger, Andrew J, Schilling, Frederic C, Bovey, Frank A, Zeigler, John M
Format: Journal Article
Language:English
Published: Washington, DC American Chemical Society 01-10-1986
Subjects:
Applied sciences
Exact sciences and technology
Inorganic and organomineral polymers
Other techniques and industries
Physicochemistry of polymers
Properties and characterization
Electron diffractometry
Solid state
Polysilane
X ray diffractometry
Silicon polymer
Crystalline structure
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Description
Bibliography:ark:/67375/TPS-9G8BNHXQ-Q
istex:B6706BEE01E6F7AD3B41C85C96F7C393CC4501AF
ISSN:0024-9297
1520-5835
DOI:10.1021/ma00164a037