Evolution of Defects, Morphology, and Strain during FAMAPbI3 Perovskite Vacuum Deposition: Insights from In Situ Photoluminescence and X‑ray Scattering

• Published in: ACS applied materials & interfaces Vol. 16; no. 27; pp. 35723 - 35731
• Main Authors: Held, Vladimir, Mrkyvkova, Nada, Halahovets, Yuriy, Nádaždy, Peter, Vegso, Karol, Vlk, Aleš, Ledinský, Martin, Jergel, Matej, Bernstorff, Sigrid, Keckes, Jozef, Schreiber, Frank, Siffalovic, Peter
• Format: Journal Article
• Language: English
• Published: American Chemical Society 10-07-2024
• Subjects: Surfaces, Interfaces, and Applications; lead-halide perovskites; intrinsic stress; vacuum deposition; in situ characterization; defects
• ISSN: 1944-8244; 1944-8252; 1944-8252
• DOI: 10.1021/acsami.4c04095

At present, the power conversion efficiency of single-junction perovskite-based solar cells reaches over 26%. The further efficiency increase of perovskite-based optoelectronic devices is limited mainly by defects, causing the nonradiative recombination of charge carriers. To improve efficiency and ensure reproducible fabrication of high-quality layers, it is crucial to understand the perovskite nucleation and growth mechanism along with associated process control to reduce the defect density. In this study, we investigate the growth kinetics of a promising narrow bandgap perovskite, formamidinium methylammonium lead iodide (FAMAPbI3), for high-performance single-junction solar cells. The temporal evolution of structural and optoelectronic properties during FAMAPbI3 vacuum codeposition was inspected in real time by grazing-incidence wide-angle X-ray scattering and photoluminescence. Such a combination of analytical techniques unravels the evolution of intrinsic defect density and layer morphology correlated with lattice strain from the early stages of the perovskite deposition.