Search Results - "van Aert, S"

Controlled lateral anisotropy in correlated manganite heterostructures by interface-engineered oxygen octahedral coupling by Liao, Z., Huijben, M., Zhong, Z., Gauquelin, N., Macke, S., Green, R. J., Van Aert, S., Verbeeck, J., Van Tendeloo, G., Held, K., Sawatzky, G. A., Koster, G., Rijnders, G.

“…Controlled in-plane rotation of the magnetic easy axis in manganite heterostructures by tailoring the interface oxygen network could allow the development of…”
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StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images by De Backer, A., van den Bos, K.H.W., Van den Broek, W., Sijbers, J., Van Aert, S.

“…An efficient model-based estimation algorithm is introduced to quantify the atomic column positions and intensities from atomic resolution (scanning)…”
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Progress and new advances in simulating electron microscopy datasets using MULTEM by Lobato, I., Van Aert, S., Verbeeck, J.

“…A new version of the open source program MULTEM is presented here. It includes a graphical user interface, tapering truncation of the atomic potential, CPU…”
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Atom counting in HAADF STEM using a statistical model-based approach: Methodology, possibilities, and inherent limitations by De Backer, A., Martinez, G.T., Rosenauer, A., Van Aert, S.

“…In the present paper, a statistical model-based method to count the number of atoms of monotype crystalline nanostructures from high resolution high-angle…”
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Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images by Fatermans, J, den Dekker, A J, Müller-Caspary, K, Lobato, I, O'Leary, C M, Nellist, P D, Van Aert, S

“…Single atom detection is of key importance to solving a wide range of scientific and technological problems. The strong interaction of electrons with matter…”
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Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy by Martinez, G.T., Rosenauer, A., De Backer, A., Verbeeck, J., Van Aert, S.

“…High angle annular dark field scanning transmission electron microscopy (HAADF STEM) images provide sample information which is sensitive to the chemical…”
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Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques by Gauquelin, N., van den Bos, K.H.W., Béché, A., Krause, F.F., Lobato, I., Lazar, S., Rosenauer, A., Van Aert, S., Verbeeck, J.

“…•We report a quantitative comparison between TEM techniques.•Statistical parameter estimation theory is used to measure column positions.•Light and heavy…”
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Deep convolutional neural networks to restore single-shot electron microscopy images by Lobato, I., Friedrich, T., Van Aert, S.

“…Advanced electron microscopy techniques, including scanning electron microscopes (SEM), scanning transmission electron microscopes (STEM), and transmission…”
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Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy by Van Aert, S., Verbeeck, J., Erni, R., Bals, S., Luysberg, M., Dyck, D. Van, Tendeloo, G. Van

“…A model-based method is proposed to relatively quantify the chemical composition of atomic columns using high angle annular dark field (HAADF) scanning…”
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Atomic scale dynamics of ultrasmall germanium clusters by Bals, S., Van Aert, S., Romero, C.P., Lauwaet, K., Van Bael, M.J., Schoeters, B., Partoens, B., Yücelen, E., Lievens, P., Van Tendeloo, G.

“…Starting from the gas phase, small clusters can be produced and deposited with huge flexibility with regard to composition, materials choice and cluster size…”
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Site occupation of Nb atoms in ternary Ni–Ti–Nb shape memory alloys by Shi, H., Frenzel, J., Martinez, G.T., Van Rompaey, S., Bakulin, A., Kulkova, S., Van Aert, S., Schryvers, D.

“…Nb occupancy in the austenite B2-NiTi matrix and Ti2Ni phase in Ni–Ti–Nb shape memory alloys was investigated by aberration-corrected scanning transmission…”
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Correction of non-linear thickness effects in HAADF STEM electron tomography by Van den Broek, W., Rosenauer, A., Goris, B., Martinez, G.T., Bals, S., Van Aert, S., Van Dyck, D.

“…In materials science, high angle annular dark field scanning transmission electron microscopy is often used for tomography at the nanometer scale. In this…”
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How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images? by Alania, M., De Backer, A., Lobato, I., Krause, F.F., Van Dyck, D., Rosenauer, A., Van Aert, S.

“…In this paper, we investigate how precise atoms of a small nanocluster can ultimately be located in three dimensions (3D) from a tilt series of images acquired…”
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Estimation of unknown structure parameters from high-resolution (S)TEM images: What are the limits? by den Dekker, A.J., Gonnissen, J., De Backer, A., Sijbers, J., Van Aert, S.

“…Statistical parameter estimation theory is proposed as a quantitative method to measure unknown structure parameters from electron microscopy images. Images…”
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Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images by Gonnissen, J., De Backer, A., den Dekker, A. J., Martinez, G. T., Rosenauer, A., Sijbers, J., Van Aert, S.

“…We report an innovative method to explore the optimal experimental settings to detect light atoms from scanning transmission electron microscopy (STEM) images…”
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Determination of the atomic width of an APB in ordered CoPt using quantified HAADF-STEM by Akamine, H., van den Bos, K.H.W., Gauquelin, N., Farjami, S., Van Aert, S., Schryvers, D., Nishida, M.

“…Anti-phase boundaries (APBs) in an ordered CoPt alloy are planar defects which disturb the ordered structure in their vicinity and decrease the magnetic…”
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Atomic resolution mapping of phonon excitations in STEM-EELS experiments by Egoavil, R., Gauquelin, N., Martinez, G.T., Van Aert, S., Van Tendeloo, G., Verbeeck, J.

“…Atomically resolved electron energy-loss spectroscopy experiments are commonplace in modern aberration-corrected transmission electron microscopes. Energy…”
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Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations by Schryvers, D., Salje, E.K.H., Nishida, M., De Backer, A., Idrissi, H., Van Aert, S.

“…The present contribution gives a review of recent quantification work of atom displacements, atom site occupations and level of crystallinity in various…”
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Advanced three-dimensional electron microscopy techniques in the quest for better structural and functional materials by Schryvers, D, Cao, S, Tirry, W, Idrissi, H, Van Aert, S

“…After a short review of electron tomography techniques for materials science, this overview will cover some recent results on different shape memory and…”
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A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projection by De Backer, A., Bals, S., Van Aert, S.

“…Quantitative structure determination is needed in order to study and understand nanomaterials at the atomic scale. Materials characterisation resulting in…”
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