Search Results - "de Mesquita Filho, Antonio Carneiro"

A 99.95% linearity readout circuit with 72 dB dynamic range for active pixel sensors by Sá, Leonardo Bruno, Dias, Mauricio Henrique Costa, Dupret, Antoine, Mesquita Filho, Antonio Carneiro

“…Summary One of the main sources of nonlinearity and sensitivity degradation in conventional active pixel sensor (APS) architectures is the source follower…”
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Synthesis of Low Sensitivity Broadband Matching Networks Using Clonal Selection Algorithm by Teixeira Dornelles, Leandro, Bruno de Sa, Leonardo, Carneiro de Mesquita Filho, Antonio

“…This paper presents a new methodology for synthesis of broadband matching networks based on Clonal Selection Algorithms (CSA). This metaheuristic uses the…”
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Fault-Trajectory Approach for Fault Diagnosis on Analog Circuits by Savioli, Carlos Eduardo, Czendrodi, Claudio C., Calvano, Jose Vicente, Filho, Antonio Carneiro de Mesquita

“…This issue discusses the fault-trajectory approach suitability for fault diagnosis on analog networks. Recent works have shown promising results concerning a…”
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An Evolutionary Method for Synthesizing Low-Sensitivity Lossless Matching Networks by de Sá, Leonardo Bruno, Dias, Maurício Henrique Costa, de Mesquita Filho, Antonio Carneiro

“…Whereas the present practice of designing matching networks for antennas is limited to conventional topologies, requiring a significant amount of domain…”
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Synthesis method for testable electrical networks using 1st order building blocks by Calvano, José Vicente, de Mesquita Filho, Antônio Carneiro, Alves, Vladimir Castro, Lubaszewski, Marcelo Soares

“…This work presents a method for synthesizing testable continuous-time linear time-invariant electrical networks using 1st order blocks for the implementation…”
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Fault-Trajectory Approach for Fault Diagnosis on Analog Circuits by Savioli, Carlos Eduardo, Czendrodi, Claudio C, Calvano, Jose Vicente, Filho, Antonio Carneiro De Mesquita

“…Dans Design, Automation and Test in Europe - DATE'05, Munich : Allemagne (2005) This issue discusses the fault-trajectory approach suitability for fault…”
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Fault Models and Test Generation for OpAmp Circuits--The FFM by Calvano, José Vicente, de Mesquita Filho, Antônio Carneiro, Alves, Vladimir Castro, Lubaszewski, Marcelo Soares

“…The analog VLSI technology processes are reaching the matureness, nevertheless, there is a big constraint, regarding their use on complex electronic products:…”
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