Search Results - "de Grefte, H. A. M."

Influence of annealing on the concentration profiles of boron implantations in silicon by Hofker, W. K., Werner, H. W., Oosthoek, D. P., de Grefte, H. A. M.

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Interpretation of secondary ion mass spectra by means of fingerprint spectra and secondary ion imaging by Werner, H. W., Morgan, A. E., de Grefte, H. A. M.

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