Search Results - "de Backer, Annick"

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    Advanced electron crystallography through model-based imaging by Van Aert, Sandra, De Backer, Annick, Martinez, Gerardo T, den Dekker, Arnold J, Van Dyck, Dirk, Bals, Sara, Van Tendeloo, Gustaaf

    Published in IUCrJ (01-01-2016)
    “…The increasing need for precise determination of the atomic arrangement of non-periodic structures in materials design and the control of nanostructures…”
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    Three-Dimensional Quantification of the Facet Evolution of Pt Nanoparticles in a Variable Gaseous Environment by Altantzis, Thomas, Lobato, Ivan, De Backer, Annick, Béché, Armand, Zhang, Yang, Basak, Shibabrata, Porcu, Mauro, Xu, Qiang, Sánchez-Iglesias, Ana, Liz-Marzán, Luis M, Van Tendeloo, Gustaaf, Van Aert, Sandra, Bals, Sara

    Published in Nano letters (09-01-2019)
    “…Pt nanoparticles play an essential role in a wide variety of catalytic reactions. The activity of the particles strongly depends on their three-dimensional…”
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    Locating and Controlling the Zn Content in In(Zn)P Quantum Dots by Kirkwood, Nicholas, De Backer, Annick, Altantzis, Thomas, Winckelmans, Naomi, Longo, Alessandro, Antolinez, Felipe V, Rabouw, Freddy T, De Trizio, Luca, Geuchies, Jaco J, Mulder, Jence T, Renaud, Nicolas, Bals, Sara, Manna, Liberato, Houtepen, Arjan J

    Published in Chemistry of materials (14-01-2020)
    “…Zinc is routinely employed in the synthesis of InP quantum dots (QDs) to improve the photoluminescence efficiency and carrier mobility of the resulting…”
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    Measuring Lattice Strain in Three Dimensions through Electron Microscopy by Goris, Bart, De Beenhouwer, Jan, De Backer, Annick, Zanaga, Daniele, Batenburg, K. Joost, Sánchez-Iglesias, Ana, Liz-Marzán, Luis M, Van Aert, Sandra, Bals, Sara, Sijbers, Jan, Van Tendeloo, Gustaaf

    Published in Nano letters (14-10-2015)
    “…The three-dimensional (3D) atomic structure of nanomaterials, including strain, is crucial to understand their properties. Here, we investigate lattice strain…”
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    Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp by Guzzinati, Giulio, Altantzis, Thomas, Batuk, Maria, De Backer, Annick, Lumbeeck, Gunnar, Samaee, Vahid, Batuk, Dmitry, Idrissi, Hosni, Hadermann, Joke, Van Aert, Sandra, Schryvers, Dominique, Verbeeck, Johan, Bals, Sara

    Published in Materials (28-07-2018)
    “…The rapid progress in materials science that enables the design of materials down to the nanoscale also demands characterization techniques able to analyze the…”
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    Experimental reconstructions of 3D atomic structures from electron microscopy images using a Bayesian genetic algorithm by De Backer, Annick, Van Aert, Sandra, Faes, Christel, Arslan Irmak, Ece, Nellist, Peter D., Jones, Lewys

    Published in npj computational materials (12-10-2022)
    “…We introduce a Bayesian genetic algorithm for reconstructing atomic models of monotype crystalline nanoparticles from a single projection using Z-contrast…”
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    Recent breakthroughs in scanning transmission electron microscopy of small species by van den Bos, Karel Hendrik Wouter, Altantzis, Thomas, De Backer, Annick, Van Aert, Sandra, Bals, Sara

    Published in Advances in physics: X (01-01-2018)
    “…Over the last decade, scanning transmission electron microscopy has become one of the most powerful tools to characterise nanomaterials at the atomic scale…”
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    Towards atom counting from first moment STEM images: Methodology and possibilities by Hao, Yansong, De Backer, Annick, Findlay, Scott David, Van Aert, Sandra

    Published in Ultramicroscopy (01-01-2025)
    “…•A method to quantify atomic resolution first moment STEM images was developed.•The images are modelled as a superposition of derivatives of 2D Lorentzian…”
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    Hidden Markov model for atom-counting from sequential ADF STEM images: Methodology, possibilities and limitations by De wael, Annelies, De Backer, Annick, Van Aert, Sandra

    Published in Ultramicroscopy (01-12-2020)
    “…We present a quantitative method which allows us to reliably measure dynamic changes in the atomic structure of monatomic crystalline nanomaterials from a time…”
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    Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy by De Wael, Annelies, De Backer, Annick, Jones, Lewys, Varambhia, Aakash, Nellist, Peter D, Van Aert, Sandra

    Published in Physical review letters (13-03-2020)
    “…We propose a new method to measure atomic scale dynamics of nanoparticles from experimental high-resolution annular dark field scanning transmission electron…”
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    Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions by Zhang, Zezhong, Lobato, Ivan, De Backer, Annick, Van Aert, Sandra, Nellist, Peter

    Published in Ultramicroscopy (01-04-2023)
    “…Advanced materials often consist of multiple elements which are arranged in a complicated structure. Quantitative scanning transmission electron microscopy is…”
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    Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tilt by De wael, Annelies, De Backer, Annick, Lobato, Ivan, Van Aert, Sandra

    Published in Ultramicroscopy (01-11-2021)
    “…A small sample tilt away from a main zone axis orientation results in an elongation of the atomic columns in ADF STEM images. An often posed research question…”
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