Search Results - "am Weg, Christian"
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Fast Active THz Cameras with Ranging Capabilities
Published in Journal of Infrared, Millimeter, and Terahertz Waves (01-12-2009)“…We report on the realization of two active, fully electronic THz cameras, both operating at room temperature, but at different frequencies (645 GHz and…”
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Illumination Aspects in Active Terahertz Imaging
Published in IEEE transactions on microwave theory and techniques (01-07-2010)“…Our paper focuses on illumination aspects in active terahertz imaging. First, we introduce our fast 620-GHz camera and discuss imaging with focused…”
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Terahertz profilometry at 600 GHz with 05 μm depth resolution
Published in Optics express (21-07-2008)Get full text
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Hybrid Continuous-Wave Demodulating Multipixel Terahertz Imaging Systems
Published in IEEE transactions on microwave theory and techniques (01-07-2010)“…We present an electrooptic (EO) terahertz imaging technique providing a demodulating detector array for phase-sensitive multipixel terahertz detection. The…”
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Continuous-wave terahertz imaging with a hybrid system
Published in Applied physics letters (26-02-2007)“…The authors have developed a hybrid system for coherent raster-scan imaging at 0.6 THz . It combines a high-power electronic source (a multiplied Gunn emitter)…”
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Terahertz profilometry at 600 GHz with 0.5 microm depth resolution
Published in Optics express (21-07-2008)“…Characterization of the topography of materials by interferometry in the visible or near-IR wavelength regime becomes difficult or impossible if the surface is…”
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Illumination Aspects in Active Terahertz Imaging: SPECIAL ISSUE ON TERAHERTZ TECHNOLOGY
Published in IEEE transactions on microwave theory and techniques (2010)Get full text
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On the way to an active terahertz camera: Optic design and its experimental verification
Published in 2007 Joint 32nd International Conference on Infrared and Millimeter Waves and the 15th International Conference on Terahertz Electronics (01-09-2007)“…We report on the simulation of a terahertz optics setup with the commercial, optic-design software package Zemax. We show that the analysis of both diffraction…”
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