Search Results - "Zintler, A."
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FIB based fabrication of an operative Pt/HfO2/TiN device for resistive switching inside a transmission electron microscope
Published in Ultramicroscopy (01-10-2017)“…•Fabrication of an operational resistive switching device for in situ TEM biasing.•The device is based on a Pt/HfO2/TiN metal-insulator-metal (MIM)…”
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Journal Article -
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Atomically interface engineered micrometer-thick SrMoO3 oxide electrodes for thin-film BaxSr1-xTiO3 ferroelectric varactors tunable at low voltages
Published in APL materials (01-05-2019)“…In the field of oxide electronics, there has been tremendous progress in the recent years in atomic engineering of functional oxide thin films with controlled…”
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Journal Article -
3
Production of Fe nanoparticles from γ-Fe2O3 by high-pressure hydrogen reduction
Published in Nanoscale advances (13-10-2020)“…In this work, the reduction of iron oxide γ-Fe 2 O 3 nanoparticles by hydrogen at high pressures is studied. Increasing the hydrogen pressure enables reduction…”
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Journal Article -
4
Production of Fe nanoparticles from γ-FeO by high-pressure hydrogen reduction
Published in Nanoscale advances (13-10-2020)“…In this work, the reduction of iron oxide γ-Fe 2 O 3 nanoparticles by hydrogen at high pressures is studied. Increasing the hydrogen pressure enables reduction…”
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Journal Article -
5
Production of Fe nanoparticles from γ-Fe 2 O 3 by high-pressure hydrogen reduction
Published in Nanoscale advances (13-10-2020)“…In this work, the reduction of iron oxide γ-Fe 2 O 3 nanoparticles by hydrogen at high pressures is studied. Increasing the hydrogen pressure enables reduction…”
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Journal Article -
6
Atomically interface engineered micrometer-thick SrMoO3 oxide electrodes for thin-film Ba x Sr1- x TiO3 ferroelectric varactors tunable at low voltages
Published in APL materials (01-05-2019)“…In the field of oxide electronics, there has been tremendous progress in the recent years in atomic engineering of functional oxide thin films with controlled…”
Get full text
Journal Article -
7
FIB based fabrication of an operative Pt/HfO 2 /TiN device for resistive switching inside a transmission electron microscope
Published in Ultramicroscopy (01-10-2017)“…Recent advances in microelectromechanical systems (MEMS) based chips for in situ transmission electron microscopy are opening exciting new avenues in nanoscale…”
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Journal Article