Search Results - "Zheludeva, S.I."

Arrangement of trace metal contaminations in thin films of liquid crystals studied by X-ray standing wave technique by Novikova, N.N., Zheludeva, S.I., Stepina, N.D., Tolstikhina, A.L., Gaynutdinov, R.V., Haase, W., Erko, A.I., Knyazev, A.A., Galyametdinov, Yu.G.

“…X-ray standing wave method has been applied to investigate the molecular organization in Langmuir–Blodgett films of liquid-crystalline lanthanide complex…”
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Inversion of selective binding of transition metal ions by Langmuir monolayers of amphiphilic cyclen by Kalinina, M.A., Arslanov, V.V., Zheludeva, S.I., Tereschenko, E. Yu

“…Selective binding of Cu(II), Ni(II), and Zn(II) from aqueous solutions of transition metal salts and their mixtures by Langmuir monolayers of dicetyl cyclen…”
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Surface-sensitive X-ray diffraction methods: physics, applications and related X-ray and SR instrumentation by Kovalchuk, M.V, Kazimirov, A.Yu, Zheludeva, S.I

“…The review of the surface-sensitive X-ray diffraction methods including surface X-ray diffraction and X-ray standing wave method is presented. The discussion…”
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X-ray instrumentation for SR beamlines by Kovalchuk, M.V., Shilin, Yu.N., Zheludeva, S.I., Aleshko-Ozhevsky, O.P., Arutynyan, E.H., Kheiker, D.M., Kreines, A.Ya, Lider, V.V., Pashaev, E.M., Shilina, N.Yu, Shishkov, V.A.

“…The main possibilities and parameters of experimental X-ray stations are presented: “Protein crystallography”, “X-ray structure analysis”, “High-precision…”
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Modular goniometer set for high-resolution X-ray diffraction experiments using synchrotron radiation by Kovalchuk, M.V., Zheludeva, S.I., Kreines, A.Ya, Shilin, Yu.N., Shilina, N.Yu, Shishkov, V.A.

“…A set of goniometer modules is described that allows easy assembling of the necessary optical layouts for experiments using synchrotron radiation. The…”
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Langmuir monolayers on water surface investigated by X-ray total reflection fluorescence by Zheludeva, S.I, Novikova, N.N, Konovalov, O.V, Kovalchuk, M.V, Stepina, N.D, Tereschenko, E.Yu

“…Langmuir monolayers of metal-rich phthalocyanines (Pc) and phospholipid at air/water interface have been studied by X-ray total reflection fluorescence at SR…”
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New method of ultra-thin film characterization applied to the investigation of C/Ni/C structures under heat load by Zheludeva, S.I., Kovalchuk, M.V., Novikova, N.N., Sosphenov, A.N., Malysheva, N.E., Salashenko, N.N., Akhsakhalyan, A.D., Platonov, Yu.Yu, Cernik, R.I., Collins, S.P.

“…A new technique for measuring the thickness and density of ultra-thin films has been developed. Films of the order of tens of angstroms have been studied by…”
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