Search Results - "Zhang, Jian F"

Causes of deaths in children younger than 5 years in China in 2008 by Rudan, Igor, Prof, Chan, Kit Yee, PhD, Zhang, Jian SF, MSc, Theodoratou, Evropi, PhD, Feng, Xing Lin, PhD, Salomon, Joshua A, PhD, Lawn, Joy E, PhD, Cousens, Simon, Prof, Black, Robert E, Prof, Guo, Yan, Prof, Campbell, Harry, Prof

“…Summary Background Previous estimates of the global burden of disease for children have not included much information from China, leading to a large gap in…”
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Effects of Dehydration and Rehydration on Cognitive Performance and Mood among Male College Students in Cangzhou, China: A Self-Controlled Trial by Zhang, Na, Du, Song M, Zhang, Jian F, Ma, Guan S

“…Water accounts for 75% of brain mass. Associations may exist between hydration and cognitive performance. The objective of this study was to investigate the…”
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Characterizing and Modeling RTN Under Real Circuit Bias Conditions by Tok, Kean H., Zhang, Jian F., Brown, James, Ji, Zhigang, Zhang, Weidong, Marsland, John S.

“…Random telegraph noise (RTN) has attracted much attention, as it becomes higher for smaller devices. Early works focused on RTN in linear drain current,…”
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AC RTN: Testing, Modeling, and Prediction by Tok, Kean H., Zhang, Jian F., Brown, James, Ye, Zengliang, Ji, Zhigang, Zhang, Weidong, Marsland, John S.

“…Random telegraph noise (RTN) adversely induces time dependent device-to-device variations and requires modeling to optimize circuit design. Many early works…”
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An Integral Methodology for Predicting Long-Term RTN by Tok, Kean H., Mehedi, Mehzabeen, Zhang, Jian F., Brown, James, Ye, Zengliang, Ji, Zhigang, Zhang, Weidong, Marsland, John S., Asenov, Asen, Georgiev, Vihar

“…Random telegraph noise (RTN) adversely impacts circuit performance and this impact increases for smaller devices and lower operation voltage. To optimize the…”
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An integrated method for extracting the statistical distribution of RTN time constants by Mehedi, Mehzabeen, Tok, Kean H., Zhang, Jian F., Ji, Zhigang, Ye, Zengliang, Zhang, Weidong, Marsland, John S.

“…Modelling Random Telegraph Noise (RTN) is a challenging task and its accuracy is generally unknown. The Monte Carlo modelling in the time domain requires the…”
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Estimating pneumonia deaths of post-neonatal children in countries of low or no death certification in 2008 by Theodoratou, Evropi, Zhang, Jian Shayne F, Kolcic, Ivana, Davis, Andrew M, Bhopal, Sunil, Nair, Harish, Chan, Kit Yee, Liu, Li, Johnson, Hope, Rudan, Igor, Campbell, Harry

“…Pneumonia is the leading cause of child deaths globally. The aims of this study were to: a) estimate the number and global distribution of pneumonia deaths for…”
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Energy Distribution of Positive Charges in Al2O3/GeO2/Ge pMOSFETs by JIGANG MA, ZHANG, Jian F, CHALKER, Paul, ZHIGANG JI, BENBAKHTI, Brahim, WEI ZHANG, MITARD, Jerome, KACZER, Ben, GROESENEKEN, Guido, HALL, Steve, ROBERTSON, John

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An evaluation of emerging vaccines for childhood pneumococcal pneumonia by Webster, Julia, Theodoratou, Evropi, Nair, Harish, Seong, Ang Choon, Zgaga, Lina, Huda, Tanvir, Johnson, Hope L, Madhi, Shabir, Rubens, Craig, Zhang, Jian Shayne F, El Arifeen, Shams, Krause, Ryoko, Jacobs, Troy A, Brooks, Abdullah W, Campbell, Harry, Rudan, Igor

“…Pneumonia is the leading cause of child mortality worldwide. Streptococcus pneumoniae (SP) or pneumococcus is estimated to cause 821,000 child deaths each…”
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An evaluation of emerging vaccines for childhood meningococcal disease by Choudhuri, Debajeet, Huda, Tanvir, Theodoratou, Evropi, Nair, Harish, Zgaga, Lina, Falconer, Rachel, Luksic, Ivana, Johnson, Hope L, Zhang, Jian Shayne F, El Arifeen, Shams, Nelson, Christopher B, Borrow, Ray, Campbell, Harry, Rudan, Igor

“…Meningococcal meningitis is a major cause of disease worldwide, with frequent epidemics particularly affecting an area of sub-Saharan Africa known as the…”
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Energy Distribution of Positive Charges in / pMOSFETs by Jigang Ma, Zhang, Jian F., Zhigang Ji, Benbakhti, Brahim, Wei Zhang, Mitard, Jerome, Kaczer, Ben, Groeseneken, Guido, Hall, Steve, Robertson, John, Chalker, Paul

“…The high hole mobility of Ge makes it a strong candidate for end of roadmap pMOSFETs and low interface states have been achieved for the Al 2 O 3 -GeO 2 -Ge…”
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Stress-Induced Positive Charge in Hf-Based Gate Dielectrics: Impact on Device Performance and a Framework for the Defect by Zhao, Ce Z., Zhang, Jian F., Chang, Mo Huai, Peaker, A. R., Hall, Stephen, Groeseneken, Guido, Pantisano, Luigi, De Gendt, Stefan, Heyns, Marc

“…A Hf-based dielectric has been selected to replace SiON for CMOS technologies. When compared with SiON, Hf dielectrics can suffer from higher instability…”
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New Analysis Method for Time-Dependent Device-To-Device Variation Accounting for Within-Device Fluctuation by Meng Duan, Zhang, Jian F., Zhigang Ji, Wei Dong Zhang, Kaczer, Ben, Schram, Tom, Ritzenthaler, Romain, Groeseneken, Guido, Asenov, Asen

“…Variability of nanometer-size devices is a major challenge for circuit design. Apart from the as-fabricated variability, the postfabrication degradation…”
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Efficacy and effectiveness of 20 child health interventions in China: Systematic review of Chinese literature by Zhang, Jian Shayne F

“…The research production of the Chinese academics for the past few decades, which is being published in more than nine thousands of Chinese academic…”
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Dominant Layer for Stress-Induced Positive Charges in Hf-Based Gate Stacks by Zhang, J.F., Mo Huai Chang, Zhigang Ji, Lin Lin, Ferain, I., Groeseneken, G., Pantisano, L., De Gendt, S., Heyns, M.M.

“…Positive charges in Hf-based gate stacks play an important role in the negative bias temperature instability of pMOSFETs, and their suppression is a pressing…”
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NBTI prediction and its induced time dependent variation by Zhang, Jian F., Meng Duan, Zhigang Ji, Weidong Zhang

“…Negative bias temperature instability (NBTI) prediction relies on a reliable extraction of power exponents from its kinetics. When measured by fast pulse…”
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Assessment of capture cross sections and effective density of electron traps generated in silicon dioxides by Mo Huai Chang, Zhang, J.F., Zhang, W.D.

“…Generation of acceptor-like electron traps in gate oxides is an important source for device instability. Despite previous efforts, capture cross sections are…”
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Epidemiology and aetiology of maternal bacterial and viral infections in low- and middle-income countries by Velu, Prasad Palani, Gravett, Courtney A, Roberts, Tom K, Wagner, Thor A, Zhang, Jian Shayne F, Rubens, Craig E, Gravett, Michael G, Campbell, Harry, Rudan, Igor

“…Maternal morbidity and mortality in low- and middle-income countries has remained exceedingly high. However, information on bacterial and viral maternal…”
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Epidemiology and aetiology of maternal parasitic infections in low- and middle-income countries by Roberts, Tom, Gravett, Courtney A, Velu, Prasad Palani, Theodoratou, Evropi, Wagner, Thor A, Zhang, Jian Shayne F, Campbell, Harry, Rubens, Craig E, Gravett, Michael G, Rudan, Igor

“…There have been very few systematic reviews looking at maternal infections in the developing world, even though cutting maternal mortality by three quarters is…”
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Causes of death in children younger than 5 years in China in 2008 – Authors' reply by Rudan, Igor, Chan, Kit Yee, Zhang, Jian Shayne F, Theodoratou, Evropi, Guo, Yan, Campbell, Harry

“…[...] we believe that the estimates of proportional causes of death in our paper should be considered reliable and that the rapid decline in pneumonia…”
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