Search Results - "Zanin, I.E"

Formation of the Al3Si metastable phase in Al-Si films obtained by ion-beam sputtering according to experimental and theoretical data by Terekhov, V.A., Domashevskaya, E.P., Kurganskii, S.I., Nesterov, D.N., Barkov, K.A., Radina, V.R., Velichko, K.E., Zanin, I.E., Sitnikov, A.V., Agapov, B.L.

“…•Al1-xSix films obtained by ion beam sputtering of an Al-Si composite target.•Formation of an ordered Al3Si phase with a Cu3Au (Pm3m) type structure…”
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Rearrangement of the optical properties of a-SiOx: H films after crystallization of silicon nanoclusters by Terekhov, V.A., Terukov, E.I., Undalov, Yu. K., Barkov, K.A., Seredin, P.V., Goloshchapov, D.L., Minakov, D.A., Popova, E.V., Zanin, I.E., Serbin, O.V., Trapeznikova, I.N.

“…The results of investigations on crystallization of silicon nanoclusters in a-SiOx matrix have shown that, even at the very fast annealing using pulse photonic…”
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Phase Formation and Electronic Structure Peculiarities in the [Al.sub.1 - x][Si.sub.x] Film Composites under the Conditions of Magnetron and Ion-Beam Sputtering by Terekhov, V.A, Usol'tseva, D.S, Serbin, O.V, Zanin, I.E, Kulikova, T.V, Nesterov, D.N, Barkov, K.A, Sitnikov, A.V, Lazaruk, S.K, Domashevskaya, E.P

“…The peculiarities of the phase composition and electronic structure of aluminum- silicon composite films near the [Al.sub.0.75][Si.sub.0.25] composition…”
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Structure of triglycine sulfate embedded in porous aluminum oxide by Golitsyna, O. M., Drozhdin, S. N., Zanin, I. E., Gridnev, A. E.

“…The X-ray diffraction investigations have been performed for nanocomposite materials based on porous aluminum oxide with inclusions of TGS and TGS, which is…”
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Specific features of the electronic and atomic structures of silicon single crystals in the aluminum matrix by Terekhov, V. A., Lazaruk, S. K., Usol’tseva, D. S., Leshok, A. A., Katsuba, P. S., Zanin, I. E., Spirin, D. E., Stepanova, A. A., Turishchev, S. Yu

“…Films of Al-Si nanocomposites produced by magnetron evaporation of a complex target onto a silicon substrate have been investigated using scanning electron…”
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