Search Results - "Zandi, Soma"
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Simulation of CZTSSe Thin-Film Solar Cells in COMSOL: Three-Dimensional Optical, Electrical, and Thermal Models
Published in IEEE journal of photovoltaics (01-09-2020)“…The Cu<inline-formula><tex-math notation="LaTeX">_2</tex-math></inline-formula>ZnSnS<inline-formula><tex-math…”
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Finite element simulation of perovskite solar cell: A study on efficiency improvement based on structural and material modification
Published in Solar energy (01-02-2019)“…•By structural and material modification, the PCE is increased to 17.5%.•Finite element method is used for simulation.•Flat type back and anti-reflector layer…”
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Numerical simulation of heat distribution in RGO-contacted perovskite solar cells using COMSOL
Published in Solar energy (01-02-2020)“…•3D simulations for coupled optical, electrical and thermal modules of a perovskite solar cell.•COMSOL numerical analysis applied on perovskite cells with…”
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Journal Article -
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Simulation of heat loss in Cu2ZnSn4SxSe4−x thin film solar cells: A coupled optical-electrical-thermal modeling
Published in Renewable energy (01-01-2022)“…A coupled optical-electrical-thermal modeling has been developed to investigate the heat generation and dissipation in Cu2ZnSn4SxSe4−x thin film solar cells…”
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Simulation of heat loss in Cu2ZnSn4S Se4− thin film solar cells: A coupled optical-electrical-thermal modeling
Published in Renewable energy (01-01-2022)Get full text
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6
Simplified method for the conversion of luminescence signals from silicon wafers and solar cells into implied voltages
Published in Solar energy materials and solar cells (01-06-2024)“…Electroluminescence and photoluminescence imaging of crystalline silicon solar cells are powerful characterization techniques for research and industrial…”
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Journal Article -
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Contactless External Quantum Efficiency Evaluation of Perovskite Solar Cells
Published in Conference record of the IEEE Photovoltaic Specialists Conference (09-06-2024)“…External quantum efficiency is an insightful parameter characterising solar cells, typically measured from the short circuit currents of the measured sample…”
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