Search Results - "Zafrani, M."

Recommended Test Conditions for SEB Evaluation of Planar Power DMOSFETs by Liu, S., Titus, J.L., DiCienzo, C., Huy Cao, Zafrani, M., Boden, M., Berberian, R.

“…This paper discusses issues concerning single-event burnout (SEB) and single-event gate rupture (SEGR); explains and provides a basic overview of the preferred…”
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Static and dynamic characterization of large-area high-current-density SiC Schottky diodes by Morisette, D.T., Cooper, J.A., Melloch, M.R., Dolny, G.M., Shenoy, P.M., Zafrani, M., Gladish, J.

“…The static and dynamic characteristics of large-area, high-voltage 4H-SiC Schottky barrier diodes are presented. With a breakdown voltage greater than 1200 V…”
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Analysis of Commercial Trench Power MOSFETs' Responses to ^ Irradiation by Liu, S., DiCienzo, C., Bliss, M., Zafrani, M., Boden, M., Titus, J.L.

“…This paper presents a detailed analysis of commercial trench power MOSFET responses to Co 60 irradiation of all key d.c. electrical test parameters. Charge…”
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Radiation Results for Modern GaN-on-Si Power Transistors by Zafrani, M., Brandt, J., Strittmatter, R., Sun, B., Zhang, S., Lidow, A.

“…Latest generation GaN-on-Si power transistors (EPC7XXX Series), specifically designed for high radiation resistance and low dynamic on-resistance, are…”
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Knowledge about AIDS by Zafrani, M, McLaughlin, D G

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Influence of Beam Conditions and Energy for SEE Testing by Ferlet-Cavrois, Veronique, Schwank, James R., Liu, Sandra, Muschitiello, Michele, Beutier, Thierry, Javanainen, Arto, Hedlund, Alex, Poivey, Christian, Mohammadzadeh, Ali, Harboe-Sorensen, Reno, Santin, Giovanni, Nickson, Bob, Menicucci, Alessandra, Binois, Christian, Peyre, Daniel, Hoeffgen, Stefan Klaus, Metzger, Stefan, Schardt, Dieter, Kettunen, Heikki, Virtanen, Ari, Berger, Guy, Piquet, Bruno, Foy, Jean-Claude, Zafrani, Max, Truscott, Pete, Poizat, Marc, Bezerra, Francoise

“…The effects of heavy-ion test conditions and beam energy on device response are investigated. These effects are illustrated with two types of test vehicles:…”
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Effects of Ion Species on SEB Failure Voltage of Power DMOSFET by Liu, S., Lauenstein, Jean-Marie, Ferlet-Cavrois, V., Marec, R., Hernandez, F., Scheick, L., Bezerra, F., Muschitiello, M., Poivey, C., Sukhaseum, N., Coquelet, L., Cao, H., Carrier, D., Brisebois, M. A., Mangeret, R., Ecoffet, R., LaBel, K., Zafrani, M., Sherman, P.

“…This paper presents and explains test results showing the effect of ion species on the single event burnout (SEB) failure voltage using a SEB sensitive…”
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Effects of Ion Atomic Number on Single-Event Gate Rupture (SEGR) Susceptibility of Power MOSFETs by Lauenstein, J.-M, Goldsman, N., Liu, S., Titus, J. L., Ladbury, R. L., Kim, H. S., Phan, A. M., LaBel, K. A., Zafrani, M., Sherman, P.

“…The relative importance of heavy-ion interaction with the oxide, charge ionized in the epilayer, and charge ionized in the drain substrate, on the bias for…”
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Analysis of Commercial Trench Power MOSFETsa Responses to{rm Co}{60}$ Irradiation by Liu, S, DiCienzo, C, Bliss, M, Zafrani, M, Boden, M, Titus, J L

“…This paper presents a detailed analysis of commercial trench power MOSFET responses to Co@@u60@ irradiation of all key d.c. electrical test parameters. Charge…”
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Analysis of Commercial Trench Power MOSFETs' Responses to rm Co 60 Irradiation by Liu, S, DiCienzo, C, Bliss, M, Zafrani, M, Boden, M, Titus, J L

“…This paper presents a detailed analysis of commercial trench power MOSFET responses to Co super(60) irradiation of all key d.c. electrical test parameters…”
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Microcirculation in Acute and Chronic Kidney Diseases by Zafrani, Lara, MD, PhD, Ince, Can, PhD

“…The renal microvasculature is emerging as a key player in acute and chronic kidney diseases. Renal microvascular disease involves alterations in endothelial…”
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Single-Event and Radiation Effect on Enhancement Mode Gallium Nitride FETs by Lidow, A., Nakata, A., Rearwin, M., Strydom, J., Zafrani, A. M.

“…This paper presents responses of the latest MiGaN FETs to space radiation conditions. The new MiGaN has shown radiation tolerance to 1Mrad TID and SEGR and SEB…”
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Acute Kidney Injury in Adults With Hemophagocytic Lymphohistiocytosis by Aulagnon, Florence, MD, Lapidus, Nathanael, MD, PhD, Canet, Emmanuel, MD, Galicier, Lionel, MD, Boutboul, David, MD, PhD, Peraldi, Marie-Noelle, MD, PhD, Reuter, Danielle, MD, Bernard, Remy, MD, Schlemmer, Benoit, MD, PhD, Azoulay, Elie, MD, PhD, Zafrani, Lara, MD, PhD

“…Background Acute kidney injury (AKI) in the setting of hemophagocytic lymphohistiocytosis (HLH) is poorly characterized. This study aims to describe the…”
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The Microcirculation of the Septic Kidney by Zafrani, Lara, MD, PhD, Payen, Didier, MD, PhD, Azoulay, Elie, MD, PhD, Ince, Can, PhD

“…Abstract The renal microcirculation plays a major role in the delivery of blood and oxygen to the kidney. In sepsis, alterations in renal microvascular…”
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The Critically Ill Kidney Transplant Recipient by Canet, Emmanuel, MD, Zafrani, Lara, MD, PhD, Azoulay, Élie, MD, PhD

“…Kidney transplantation is the most common solid organ transplantation performed worldwide. Up to 6% of kidney transplant recipients experience a…”
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Bilirubin-Associated Acute Tubular Necrosis in a Kidney Transplant Recipient by Rafat, Cédric, MD, Burbach, Maren, BM, Brochériou, Isabelle, MD, PhD, Zafrani, Lara, MD, PhD, Callard, Patrice, MD, Rondeau, Eric, MD, PhD, Hertig, Alexandre, MD, PhD

“…Unlike hemoglobin or myoglobin, bilirubin, a breakdown product of the catabolism of heme molecules, usually is not seen as a nephrotoxic protein. We report the…”
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Acute Respiratory Failure in Patients with Hematologic Malignancies by Moreau, Anne-Sophie, MD, Peyrony, Olivier, MD, Lemiale, Virginie, MD, Zafrani, Lara, MD, PhD, Azoulay, Elie, MD, PhD

“…Acute respiratory failure occurs in up to 50% of patients treated for hematologic malignancies and is associated with a high case fatality rate. Because of…”
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Fabrication of a double-side IGBT by very low temperature wafer bonding by Hobart, K.D., Kub, F.J., Dolny, G., Zafrani, M., Neilson, J.M., Gladish, J., McLachlan, C.

“…A bidirectional double-side IGBT has been successfully fabricated by very low temperature direct wafer bonding for the first time. The utility of the second…”
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Evaluation on protective single event burnout test method for power DMOSFETs by Liu, S., Marec, R., Sherman, P., Titus, J. L., Bezerra, F., Ferlet-Cavrois, V., Marin, M., Sukhaseum, N., Widmer, F., Muschitiello, M., Gouyet, L., Ecoffet, R., Zafrani, M.

“…This paper evaluates protective single event burnout test method on power DMOSFETs to confirm that it provides accurate test results as the destructive test…”
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Influence of beam conditions and energy for SEE testing by Ferlet-Cavrois, V., Schwank, J. R., Liu, S., Muschitiello, M., Beutier, T., Javanainen, A., Hedlund, A., Poivey, C., Zadeh, A., Harboe-Sorensen, R., Santin, G., Nickson, B., Menicucci, A., Binois, C., Peyre, D., Hoeffgen, S. K., Metzger, S., Schardt, D., Kettunen, H., Virtanen, A., Berger, G., Piquet, B., Foy, J., Zafrani, M., Truscott, P., Poizat, M., Bezerra, F.

“…The effects of heavy-ion test conditions and beam energy on device response are investigated. These effects are illustrated with two types of test vehicles;…”
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