Search Results - "ZAPALAC, G"

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    Investigation of Detection Limits of Resistive Contact Plugs in Electron Beam Inspection Using Modeling and Simulation by De, I., Shadman, K., Zapalac, G.

    “…Electron beam inspection has been commonly used in the semiconductor fabrication process to inspect wafers for defective metal or polysilicon plugs, plugs that…”
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    Journal Article
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    Simulation of a dc electron beam strongly influenced by self-fields by Zapalac, G. H.

    “…A method is presented to simulate the transport of a dc charged particle beam strongly influenced by its self-fields. If the initial phase space of the beam is…”
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    Journal Article
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    Observation of strain-enhanced electron-spin polarization in photoemission from InGaAs by Maruyama, T, Garwin, EL, Prepost, R, Zapalac, GH, Smith, JS, Walker, JD

    Published in Physical review letters (06-05-1991)
    “…Electron-spin polarization in excess of 70% has been observed in photoemission from a 0.1-{mu}m-thick epitaxial layer of In{sub {ital x}}Ga{sub 1{minus}{ital…”
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    Journal Article
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    Fast C-V method to mitigate effects of deep levels in CIGS doping profiles by Paul, P.K., Bailey, J., Zapalac, G., Arehart, A.R.

    “…In this work, methods to determine more accurate doping profiles in semiconductors is explored where trap-induced artifacts such as hysteresis and doping…”
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    Conference Proceeding
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    A time-dependent method for characterizing the diffusion of 222Rn in concrete by Zapalac, G H

    Published in Health physics (1958) (01-08-1983)
    “…The porosity and diffusion length of concrete have been determined by measuring the time-dependent diffusion of radon through a thin slab of the material. One…”
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    Journal Article
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    Measurements of $R = \sigma_{L} / \sigma_{T}$ for 0.03 $<$ x $<$ 0.1 and fit to world data by Abe, K., Akagi, T., Anthony, P.L., Antonov, R., Arnold, R.G., Averett, T., Band, H.R., Bauer, J.M., Borel, H., Bosted, P.E., Breton, Vincent, Button-Shafer, J., Chen, J.P., Chupp, T.E., Clendenin, J., Comptour, C., Coulter, K.P., Court, G., Crabb, D., Daoudi, M., Day, D., Dietrich, F.S., Dunne, J., Dutz, H., Erbacher, R., Fellbaum, J., Feltham, A., Fonvieille, H., Frlez, E., Garvey, D., Gearhart, R., Gomez, J., Grenier, P., Griffioen, K.A., Hoibraten, S., Hughes, E.W., Hyde-Wright, C., Johnson, J.R., Kawall, D., Klein, A., Kuhn, S.E., Kuriki, M., Lindgren, R., Liu, T.J., Lombard-Nelsen, R.M., Marroncle, J., Maruyama, T., Maruyama, X.K., Mccarthy, J., Meyer, W., Meziani, Z.E., Minehart, R., Mitchell, J., Morgenstern, J., Petratos, G.G., Pitthan, R., Pocanic, D., Prescott, C., Prepost, R., Raines, P., Raue, B., Reyna, D., Rijllart, A., Roblin, Y., Rochester, L.S., Rock, S.E., Rondon, O.A., Sick, I., Smith, L.C., Smith, T.B., Spengos, M., Staley, F., Steiner, P., Stuart, L.M., Suekane, F., Szalata, Z.M., Tang, Hao, Terrien, Y., Usher, T., Walz, D., Wesselmann, F., White, J.L., Witte, K., Young, C.C., Youngman, B., Yuta, H., Zapalac, G., Zihlmann, B., Zimmermann, D.

    Published in Physics letters. B (15-04-1999)
    “…Measurements were made at SLAC of the cross section for scattering 29 GeV electrons from carbon at a laboratory angle of 4.5 degrees, corresponding to 0.03…”
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    Journal Article
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    Optoelectronic methods for characterizing uniformity in CIGS thin film solar cells by Boone, T. D., Soltz, D., Kinkhabwala, A. A., Zapalac, G., Pinarbasi, M.

    “…The areal uniformity of electrical characteristics for photovoltaic materials is crucial to achieving maximum efficiency in any solar cell technology. Various…”
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    Conference Proceeding
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    Fast C-V method to mitigate effects of deep levels in CIGS doping profiles by Paul, P. K, Bailey, J, Zapalac, G, Arehart, A. R

    Published 29-06-2017
    “…In this work, methods to determine more accurate doping profiles in semiconductors is explored where trap-induced artifacts such as hysteresis and doping…”
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    Journal Article
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    The Compton polarimeter at the SLC by Shapiro, G., Bethke, S., Chamberlain, O., Fuzesy, R., Kowitt, M., Pripstein, D., Schumm, B., Steiner, H., Zolotorev, M., Rowson, P., Blockus, D., Ogren, H., Settles, M., Fero, M., Lath, A., Calloway, D., Elia, R., Hughes, E., Junk, T., King, R., Maruyama, T., Zapalac, G.

    “…Compton scattering provides a fast and accurate measurement of the longitudinal polarization of electron beams available at linear colliders. At the SLC, green…”
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    Conference Proceeding
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    Monte Carlo simulation of a nonlaminar DC beam including the influence of self-fields by Zapalac, G.

    “…We present a method to simulate the transport of a nonlaminar DC beam under the influence of self-fields. The simulation randomly populates an initial phase…”
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    Conference Proceeding
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