Commercial production of QWIP wafers by molecular beam epitaxy

As the performance of quantum well infrared photodetectors (QWIPs) and QWIP-based imaging systems continues to improve, their demand will undoubtedly grow. This points to the importance of a reliable commercial supplier of semiconductor QWIP material on three inch and, in the near future, four-inch...

Full description

Saved in:
Bibliographic Details
Published in:Infrared physics & technology Vol. 42; no. 3; pp. 407 - 415
Main Authors: Fastenau, J.M, Liu, W.K, Fang, X.M, Lubyshev, D.I, Pelzel, R.I, Yurasits, T.R, Stewart, T.R, Lee, J.H, Li, S.S, Tidrow, M.Z
Format: Journal Article Conference Proceeding
Language:English
Published: Amsterdam Elsevier B.V 01-06-2001
Elsevier
Subjects:
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:As the performance of quantum well infrared photodetectors (QWIPs) and QWIP-based imaging systems continues to improve, their demand will undoubtedly grow. This points to the importance of a reliable commercial supplier of semiconductor QWIP material on three inch and, in the near future, four-inch substrates. Molecular beam epitaxy (MBE) is the preferred technique for growing the demanding QWIP structure, as tight control is required over the material composition and layer thickness. We report the current status of MBE-grown GaAs-based QWIP structures in a commercial production environment at IQE. Uniformity data and run-to-run reproducibility on both three-inch and four-inch GaAs substrates are quantified using alloy composition and QW thickness. Initial results on growth technology transfer to a multi-wafer MBE reactor are also presented. High-resolution X-ray diffraction measurements demonstrate GaAs QW thickness variations and AlGaAs barrier compositions changes to be less than 4% and 1% Al, respectively, across four-inch QWIP wafers from both single- and multiple-wafer MBE platforms.
ISSN:1350-4495
1879-0275
DOI:10.1016/S1350-4495(01)00100-1