Search Results - "Youn, Yangsik"

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  1. 1

    P‐9: Reduction and Mechanism of ESD Defect in IGZO‐TFT Formation by Liu, Tianzhen, Duan, Xianxue, Xu, Dezhi, Cui, Haifeng, Zhang, Zhihai, Youn, YangSik, Chen, Junsheng, Lee, SeungKyu

    “…In this paper, “IGZO deposition” and “IGZO Photo” are found to be the critical steps that occurs for ESD in Oxide TFTs. The mechanism of ESD has been studied,…”
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    Journal Article
  2. 2

    P‐62: Study on the mechanism of Block Mura in the ITO developing process via utilizing CFD simulation by Li, Xiaobao, Zhang, Zhihai, Chen, Cheng, Liu, Zhaofan, YOUN, YANGSIK, Chen, Junsheng, LEE, SEUNGKYU

    “…Herein the Block Mura is discussed. We analyze the formation mechanism of Block Mura in the ITO developing process with CFD simulation. A detailed study has…”
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    Journal Article
  3. 3

    P‐74: Study on the influence factors of TFT glass strength by Tian, Wei, Zhang, Zhihai, Duan, Xianxue, Zhang, Jun, Youn, Yangsik, Chen, Junsheng, Lee, SeungKyu, Zhao, Na, Yuan, Miao, Shi, Gaofei

    “…The strength of TFT glass is mainly affected glass material. While reducing the film thickness, profile angle or increasing the organic film through process…”
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    Journal Article
  4. 4

    P‐70: Resolving Bump Issue on Copper Surface in GI Hole of TFT‐LCDs by Wang, Yijun, Shen, Qiyu, Wang, Jianwei, Liu, Zuhong, Xu, Xufei, Liu, Zhaofan, Zhang, Xiaojie, Zhang, Zhihai, Youn, YangSik, Chen, Junsheng, Lee, SeungKyu

    “…This paper introduces a phenomenon of the SD bump on the gate layer MoNiTi(bottom)/Cu(top) in GI hole because of the worsening of adhesion between SD layer and…”
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    Journal Article
  5. 5

    P-201L: Late-News Poster: Modeling and Improvement of Invisible ITO Pattern on Touch Screen by Xu, Dezhi, Shi, Gaofei, Duan, Xianxue, Baek, Myoung Kee, Youn, Yangsik, Che, Chuncheng, Lee, SeungKyu

    “…This paper presents a mode to solve visibility issue of touch panel by regulating border profile of sensor pattern. The pattern profile can be effectively…”
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    Journal Article