Search Results - "Youn, Yangsik"
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P‐9: Reduction and Mechanism of ESD Defect in IGZO‐TFT Formation
Published in SID International Symposium Digest of technical papers (01-06-2019)“…In this paper, “IGZO deposition” and “IGZO Photo” are found to be the critical steps that occurs for ESD in Oxide TFTs. The mechanism of ESD has been studied,…”
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P‐62: Study on the mechanism of Block Mura in the ITO developing process via utilizing CFD simulation
Published in SID International Symposium Digest of technical papers (01-06-2019)“…Herein the Block Mura is discussed. We analyze the formation mechanism of Block Mura in the ITO developing process with CFD simulation. A detailed study has…”
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P‐74: Study on the influence factors of TFT glass strength
Published in SID International Symposium Digest of technical papers (01-06-2019)“…The strength of TFT glass is mainly affected glass material. While reducing the film thickness, profile angle or increasing the organic film through process…”
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P‐70: Resolving Bump Issue on Copper Surface in GI Hole of TFT‐LCDs
Published in SID International Symposium Digest of technical papers (01-06-2019)“…This paper introduces a phenomenon of the SD bump on the gate layer MoNiTi(bottom)/Cu(top) in GI hole because of the worsening of adhesion between SD layer and…”
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P-201L: Late-News Poster: Modeling and Improvement of Invisible ITO Pattern on Touch Screen
Published in SID International Symposium Digest of technical papers (01-05-2016)“…This paper presents a mode to solve visibility issue of touch panel by regulating border profile of sensor pattern. The pattern profile can be effectively…”
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