Search Results - "Yoshida, Okio"

Calculations of Image Lag in Vidicon-Type Camera Tubes. II Image Lag for Moving Object: Dynamic Image Lag by Yoshida, Okio

“…Image lags with delayed timing where the change of target illumination on a particular element occurs at a somewhat delayed time after the passing of the…”
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Calculations of Image Lag in Vidicon-Type Camera Tubes. I. Beam Discharge Lag and Total Image Lag, Including Photoconductive Lag by Yoshida, Okio, Kiuchi, Yuji

“…Image lag in vidicon-type camera tubes is analyzed, taking scanning processes with a low-velocity electron beam into consideration. As the beam landing…”
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Measurements of Lags in Vidicons Using GaP Red-Emitting Diodes as a Light Source by Shimizu, Kazuo, Iwasawa, Mineo, Yoshida, Okio

“…A novel apparatus for measuring lags in vidicons using GaP red-emitting diodes as a light source is described. By using GaP diodes, the light source becomes…”
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CdTe Resistive Sea for Silicon Vidicon Targets by Yoshida, Okio, Shimizu, Kazuo

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Frame Transfer CCD Imager with Transparent Electrodes by Harada, Nozomu, Suzuki, Nobuo, Yoshida, Okio, Yano, Kensaku, Morita, Hiroshi

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A low driving voltage CCD with single layer electrode structure for area image sensor by Tanaka, N., Nakamura, N., Matsunaga, Y., Manabe, S., Tango, H., Yoshida, O.

“…A new single layer electrode two-phase CCD was studied for the purpose of realizing low driving voltage operation in inter-line transfer CCD (IT-CCD) image…”
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Analysis of signal to noise ratio of photoconductive layered solid-state imaging device by Matsunaga, Y., Hatori, F., Tango, H., Yoshida, O.

“…The signal to noise ratio of the photoconductive layered solid-state imaging device (PSID) has been theoretically derived. In this analysis the noise…”
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A random noise reduction method for an amorphous silicon photoconversion layer overlaid CCD imager by Nakamura, N., Ohsawa, S., Matsunaga, Y., Yoshida, O.

“…A novel random noise reduction (RNR) method, which can reduce random noise generated in a storage diode (SD), has been proposed and evaluated with a cell test…”
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Electric field concentration at electrode edge with decreasing amorphous silicon defect density by Ihara, Hisanori, Oba, Eiji, Iida, Yoshinori, Nozaki, Hidetoshi, Wada, Tetsunori, Furukawa, Akihiko, Manabe, Sohei, Tango, Hiroyuki, Yoshida, Okio

“…Many studies have concentrated on the decrease in a-Si defect density. However, several a-Si image sensors, such as the 2M-pixel charge coupled device (CCD)…”
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Improvement of surface morphology and bulk structure of a-SiC:H films by Ishizuka, Yoshiki, Yamaguchi, Tetsuya, Iida, Yoshinori, Nozaki, Hidetoshi, Furukawa, Akihiko, Tango, Hiroyuki, Yoshida, Okio

“…The influence of gas flow and H 2 dilution ratio on the bulk and surface properties of a-SiC:H films is discussed. Infrared and electron spin resonance studies…”
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Photoelectric Properties of As 2 Se 3 Layers by Yoshida, Okio

“…The photoelectric properties of As 2 Se 3 evaporated layers were investigated on “sandwich” type photocell. Current-voltage characteristics and persistence of…”
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Characteristics of a-Si:H films prepared by a novel laminar flow photo-chemical vapor deposition method by Yamaguchi, Tetsuya, Iida, Yoshinori, Furukawa, Akihiko, Ishizuka, Yoshiki, Nozaki, Hidetoshi, Manabe, Sohei, Tango, Hiroyuki, Yoshida, Okio

“…The a-Si:H films prepared by a laminar flow photo-chemical vapor deposition method were investigated. The SiH 2 bond content ( C SiH 2 ) in the a-Si:H film…”
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Analysis of photoelectric conversion characteristics under knee control operation for CCD imagers by Nakamura, N., Matsunaga, Y., Egawa, Y., Endo, R., Tango, H., Yoshida, O.

“…A high-light signal suppression operation, knee control operation, was evaluated in order to apply to a STACK-CCD of 2/3-in 2 M-pixel high definition…”
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A 2/3-in 2 million pixel STACK-CCD HDTV imager by Yamashita, H., Sasaki, N., Ohsawa, S., Miyagawa, R., Ohba, E., Mabuchi, K., Nakamura, N., Tanaka, N., Endoh, N., Inoue, I., Matsunaga, Y., Egawa, Y., Endo, Y., Yamaguchi, T., Iida, Y., Furukawa, A., Manabe, S., Ishizuka, Y., Ichinose, H., Niiyama, T., Ihara, H., Nozaki, H., Yanase, I., Sakuma, N., Sakakubo, T., Honda, H., Masuoka, F., Yoshida, O., Tango, H., Sano, S.

“…A 2/3-in optical format 2 M pixel STACK-CCD imager has been developed. The STACK-CCD imager, overlaid with an amorphous silicon photoconversion layer, realizes…”
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A single-layer metal-electrode CCD image sensor by Nakamura, N., Tanaka, N., Endoh, N., Matsunaga, Y., Sasaki, M., Yamashita, H., Ohsawa, S., Manabe, S., Yoshida, O.

“…A small pixel is required to reduce CCD image sensor chip size for commercial application. However, the shrinkage of pixel size adversely affects such…”
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Properties of CdSe-Sb 2 S 3 Vidicon-Type Targets by Yoshida, Okio, Shimizu, Kazuo, Kiuchi, Yuji

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A photoelectric conversion-characteristic control method for interline transfer CCD imager by Yukio Endo, Egawa, Y., Harada, N., Yoshida, O.

“…There are generally two approaches to dynamic range expansion for a solid-state imager. One is output-noise decrease. Another approach is a maximum…”
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