Search Results - "Yoo, K.D"

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  1. 1
    Clinical Outcomes in Asian Elderly Kidney Transplant Recipients: A Multicenter Cohort Study

    Clinical Outcomes in Asian Elderly Kidney Transplant Recipients: A Multicenter Cohort Study by Yoo, K.D, An, J.N, Kim, C.T, Cho, J.H, Kim, C.D, Park, S.K, Chae, D.W, Oh, Y.K, Lim, C.S, Kim, Y.S, Kim, Y.H, Lee, J.P

    Published in Transplantation proceedings (01-04-2015)
    “…Abstract Background The kidney transplantation rate in elderly patients is increasing rapidly. However, the clinical outcomes of kidney transplantation in…”
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  2. 2
    [PP.19.06] HEMODYNAMIC PARAMETERS OF COMMON CAROTID ARTERY ARE ASSOCIATED WITH ATHEROSCLEROTIC CARDIOVASCULAR DISEASE AND CARDIAC FUNCTION

    [PP.19.06] HEMODYNAMIC PARAMETERS OF COMMON CAROTID ARTERY ARE ASSOCIATED WITH ATHEROSCLEROTIC CARDIOVASCULAR DISEASE AND CARDIAC FUNCTION by Kim, G., Lee, S.N., Moon, D., Kim, J.H., Moon, K.W., Yoo, K.D., Kim, C.M.

    Published in Journal of hypertension (01-09-2017)
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  3. 3
    [PP.16.10] WHICH MEASUREMENT OF BLOOD PRESSURE IS MORE ASSOCIATED WITH ATHEROSCLEROTIC CARDIOVASCULAR DISEASE WITHOUT HYPERTENSION: CENTRAL BLOOD PRESSURE OR PERIPHERAL BLOOD PRESSURE?

    [PP.16.10] WHICH MEASUREMENT OF BLOOD PRESSURE IS MORE ASSOCIATED WITH ATHEROSCLEROTIC CARDIOVASCULAR DISEASE WITHOUT HYPERTENSION: CENTRAL BLOOD PRESSURE OR PERIPHERAL BLOOD PRESSURE? by Kim, G., Moon, D., Lee, S.N., Kim, J.H., Moon, K.W., Yoo, K.D., Kim, C.M.

    Published in Journal of hypertension (01-09-2016)
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  4. 4
    SAT-145 Inhibition of CXCR3 expression through blockade of STAT3 alpha signaling down-regulate inflammation of renal ischemia-reperfusion injury

    SAT-145 Inhibition of CXCR3 expression through blockade of STAT3 alpha signaling down-regulate inflammation of renal ischemia-reperfusion injury by PARK, J.Y., Yoo, K.D., Kim, Y.S., Yang, S.H.

    Published in Kidney international reports (01-07-2019)
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  5. 5
    Effect of plasma process-induced damage on bias temperature instability of MOSFETs

    Effect of plasma process-induced damage on bias temperature instability of MOSFETs by Jang, T.S., Ha, M.H., Yoo, K.D., Kang, B.K.

    Published in Microelectronic engineering (01-03-2006)
    “…For a surface-channel n-MOSFET and a buried-channel p-MOSFET, the effect of plasma process-induced damage on bias temperature instability (BTI) was…”
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  6. 6
    Plasma process induced damages on n-MOSFET with plasma oxidized and nitrided gate dielectrics

    Plasma process induced damages on n-MOSFET with plasma oxidized and nitrided gate dielectrics by Jang, T.S., Ha, M.H., Yoo, K.D., Kang, B.K.

    Published in Microelectronic engineering (01-11-2004)
    “…The material and electrical properties of a 30 Å-thick gate oxide, which is fabricated using plasma oxidation and subsequently nitrided in N 2 plasma, are…”
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  7. 7
    Assessment of electro-static discharge robustness based on the monitoring of lattice temperature of silicon

    Assessment of electro-static discharge robustness based on the monitoring of lattice temperature of silicon by Yoo, K.D., Lim, G.H., Jin, J.H., Choi, K.H.

    “…In this paper, we demonstrate that it is possible to develop an optimum ESD protection device by comparing the relative ESD robustness of each device, based on…”
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