Search Results - "Yess, Kim"
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Extremely Low-Force Debonding of Thinned CMOS Substrate by Laser Release of a Temporary Bonding Material
Published in 2016 IEEE 66th Electronic Components and Technology Conference (ECTC) (01-05-2016)“…Over the past few years, temporary bonding has spread together with the development of 3D stacked IC (SIC) technology. Maturity of the various processes has…”
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Conference Proceeding -
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Advances in Temporary Carrier Technology for High-Density Fan-Out Device Build-up
Published in 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) (01-05-2019)“…As the need for higher degrees of function integration on chips continues to rise, chip-to-chip connection density exponentially increases. The continuous push…”
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Conference Proceeding -
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The Growing Application Field of Laser Debonding: From Advanced Packaging to Future Nanoelectronics
Published in 2019 International Wafer Level Packaging Conference (IWLPC) (01-10-2019)“…Thin substrate handling has become one of the cornerstone technologies that enabled the development of 3D stacked ICs over the past years. Temporary wafer…”
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Conference Proceeding -
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Novel Temporary Bonding and Debonding Solutions Enabling an Ultrahigh Interonnect Density Fo-Wlp Structure Assembly with Quasi-Zero Die Shift
Published in 2019 International Wafer Level Packaging Conference (IWLPC) (01-10-2019)“…Next-generation temporary bonding adhesive material is introduced into imec's high interconnect density flip chip on fan-out wafer-level package (FC FOWLP)…”
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Conference Proceeding -
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Advances in Thin Wafer Debonding and Ultrathin 28-nm FinFET Substrate Transfer
Published in 2017 IEEE 67th Electronic Components and Technology Conference (ECTC) (01-05-2017)“…Over the past few years, temporary bonding has expanded together with the development of 3D stacked IC (SIC) technology. As maturity of the various processes…”
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Conference Proceeding -
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Single-release-layer process for temporary bonding applications in the 3D integration area
Published in 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) (01-05-2015)“…One of the key aspects in 3D technology today is the bonding/debonding of a device wafer to a carrier wafer to enable wafer thinning and subsequent backside…”
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Conference Proceeding