Search Results - "Yess, Kim"

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    Advances in Temporary Carrier Technology for High-Density Fan-Out Device Build-up by Podpod, Arnita, Phommahaxay, Alain, Bex, Pieter, Slabbekoorn, John, Bertheau, Julien, Salahoueldhadj, Abdellah, Sleeckx, Erik, Miller, Andy, Beyer, Gerald, Beyne, Eric, Guerrero, Alice, Yess, Kim, Arnold, Kim

    “…As the need for higher degrees of function integration on chips continues to rise, chip-to-chip connection density exponentially increases. The continuous push…”
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    Conference Proceeding
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    Advances in Thin Wafer Debonding and Ultrathin 28-nm FinFET Substrate Transfer by Phommahaxay, Alain, Jourdain, Anne, Potoms, Goedele, Verbinnen, Greet, Sleeckx, Erik, Beyer, Gerald, Beyne, Eric, Guerrero, Alice, Dongshun Bai, Yess, Kim, Arnold, Kim

    “…Over the past few years, temporary bonding has expanded together with the development of 3D stacked IC (SIC) technology. As maturity of the various processes…”
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    Conference Proceeding
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    Single-release-layer process for temporary bonding applications in the 3D integration area by Jourdain, Anne, Phommahaxay, Alain, Velenis, Dimitrios, Guerrero, Alice, Dongshun Bai, Yess, Kim, Arnold, Kim, Miller, Andy, Rebibis, Kenneth, Beyer, Gerald, Beyne, Eric

    “…One of the key aspects in 3D technology today is the bonding/debonding of a device wafer to a carrier wafer to enable wafer thinning and subsequent backside…”
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    Conference Proceeding