Experimental evaluation of hot electron reliability on differential Clapp-VCO

This paper studies the hot-carrier stressed property of a series-tuned all-n core voltage controlled oscillator (VCO). A differential Clapp-VCO has been successfully implemented in the 0.13m CMOS process and it uses a series-tuned resonator. Two single ended nMOS-core Clapp-VCOs are used to form a d...

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Bibliographic Details
Published in:	Microelectronics and reliability Vol. 53; no. 2; pp. 254 - 258
Main Authors:	Jang, S.L., Yuan, J.S., Yen, S.D., Kritchanchai, E., Huang, G.W.
Format:	Journal Article
Language:	English
Published:	Kidlington Elsevier Ltd 01-02-2013 Elsevier
Subjects:	Applied sciences Circuit properties Circuits CMOS Design. Technologies. Operation analysis. Testing Electric, optical and optoelectronic circuits Electronic circuits Electronics Exact sciences and technology Hot electrons Integrated circuits Oscillations Oscillators Oscillators, resonators, synthetizers Resonators Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Simulation Voltage controlled oscillators Phase noise Electric transformer Resonator Voltage controlled oscillator Oscillation frequency Implementation Complementary MOS technology Hot carrier Hot electron Reliability NMOS technology Interconnected system Damaging
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Summary:	This paper studies the hot-carrier stressed property of a series-tuned all-n core voltage controlled oscillator (VCO). A differential Clapp-VCO has been successfully implemented in the 0.13m CMOS process and it uses a series-tuned resonator. Two single ended nMOS-core Clapp-VCOs are used to form a differential VCO by the aid of a cross-coupled nMOS pair and a transformer. The measured results show that the fresh Clapp-VCO operates from 18.8 to 22.2GHz and hot-carrier stressed experimental data indicate that the damage increases the oscillation frequency and degrades the phase noise of oscillator. Mixed-mode simulation results are used to show the hot-carrier physics to the circuit.
Bibliography:	ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23
ISSN:	0026-2714 1872-941X
DOI:	10.1016/j.microrel.2012.08.004