Search Results - "Yen, Bing K."

Perpendicular magnetic tunnel junction with thin CoFeB/Ta/Co/Pd/Co reference layer by Gan, Huadong, Malmhall, Roger, Wang, Zihui, Yen, Bing K, Zhang, Jing, Wang, Xiaobin, Zhou, Yuchen, Hao, Xiaojie, Jung, Dongha, Satoh, Kimihiro, Huai, Yiming

“…Integration of high density spin transfer torque magnetoresistance random access memory requires a thin stack (less than 15 nm) of perpendicular magnetic…”
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Perpendicular magnetic tunneling junction switching dynamic modes, extreme events, and performance scaling by Wang, Xiaobin, Wang, Zihui, Hao, Xiaojie, Gan, Huadong, Xu, Pengfa, Jung, Dongha, Satoh, Kimihiro, Zhou, Yuchen, Zhang, Jing, Yen, Bing K., Huai, Yiming

“…The performance of the state-of-the-art perpendicular magnetic tunneling junction (pMTJ) device is fundamentally determined by the physics of material “extreme…”
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Reaction Synthesis of Titanium Silicides via Self-Propagating Reaction Kinetics by Yen, Bing K., Aizawa, Tatsuhiko, Kihara, Junji

“…Self‐propagating exothermic reactions in the titanium‐silicon system induced by mechanical milling, shock loading, and thermal ignition of elemental powder…”
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Spin-Orbitronics Memory Device With Matching and Self-Reference Functionality by Xiaobin Wang, Keshtbod, Parviz, Zihui Wang, Satoh, Kimihiro, Yen, Bing K., Yiming Huai

“…Spin-orbit torque generated by spin-torque interaction provides a new writing mechanism for spintronic devices. This paper investigates spintronic memory…”
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Origin of low-friction behavior in graphite investigated by surface x-ray diffraction by Yen, Bing K., Schwickert, Birgit E., Toney, Michael F.

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Emulating media defect corrosion by Qing Dai, Prada-Silva, G., Yen, B.K., Marchon, B., Rettner, C.T.

“…This paper presents studies designed toward understanding media defect corrosion. Focused ion beam technology is used to create well-defined defects exposing…”
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New methodologies for measuring film thickness, coverage, and topography by Mate, C.M., Yen, B.K., Miller, D.C., Toney, M.F., Scarpulla, M., Frommer, J.E.

“…We describe how the techniques of X-ray reflectivity (XRR), electron spectroscopy for chemical analysis (ESCA), and atomic force microscopy (AFM) can be used…”
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High performance perpendicular magnetic tunnel junction with Co/Ir interfacial anisotropy for embedded and standalone STT-MRAM applications by Huai, Yiming, Gan, Huadong, Wang, Zihui, Xu, Pengfa, Hao, Xiaojie, Yen, Bing K., Malmhall, Roger, Pakala, Nirav, Wang, Cory, Zhang, Jing, Zhou, Yuchen, Jung, Dongha, Satoh, Kimihiro, Wang, Rongjun, Xue, Lin, Pakala, Mahendra

“…High volume spin transfer torque magnetoresistance random access memory (STT-MRAM) for standalone and embedded applications requires a thin perpendicular…”
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The effect of humidity on friction and wear of an aluminium-silicon eutectic alloy by YEN, B. K

“…The sliding wear of an aluminium–silicon eutectic alloy against cast iron counterface in 3–100% relative humidity range has been investigated. The results show…”
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Effect of N doping on structure and properties of DLC films produced by plasma beam deposition by Yen, B.K., Thiele, J.-U., Geisler, M., Kasai, P.H., White, R.L., York, B.R., Zadoori, H., Kellock, A.J., Tang, W.C., Tsai-Wei Wu, Toney, M.F., Marchon, B.

“…A novel plasma beam source for the deposition of DLC films is described. Wide ranges of ion energy (130-250 eV) and C/sub 2/H/sub 2//N/sub 2/ flow conditions…”
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Mechanical strength and wear resistance of 5 nm IBD carbon overcoats for magnetic disks by Scharf, T.W., Tsai-Wei Wu, Yen, B.K., Marchon, B., Barnard, J.A.

“…A micro-wear scan technique has been used to evaluate the tribological properties and adhesion strength of ion beam deposited (IBD) CH/sub x/, CH/sub x/N/sub…”
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Toward an understanding of overcoat corrosion protection by Qing Dai, Yen, B.K., White, R.L., Peterson, P.J., Marchon, B.

“…This paper presents detailed electrochemical investigations on the role of overcoat and lubricant in head and media corrosion protection. Depending on the…”
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Microstructure and properties of ultrathin amorphous silicon nitride protective coating by Yen, Bing K., White, Richard L., Waltman, Robert J., Dai, Qing, Miller, Dolores C., Kellock, Andrew J., Marchon, Bruno, Kasai, Paul H., Toney, Michael F., York, Brian R., Deng, Hong, Xiao, Qi-Fan, Raman, Vedantham

“…The effect of N content on the structure and properties of rf reactively sputtered amorphous silicon nitride (a- SiN x ) has been studied by Rutherford…”
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X-ray diffraction study of mechanochemical synthesis and formation mechanisms of zirconium carbide and zirconium silicides by Yen, Bing K.

“…The mechanochemical synthesis and formation mechanisms of zirconium carbide (ZrC) and silicides (ZrSi 2, ZrSi, Zr 5Si 3, and Zr 2Si) by ball-milling were…”
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High Density 3D Cross-Point STT-MRAM by Huai, Yiming, Yang, Hongxin, Hao, Xiaojie, Wang, Zihui, Malmhall, Roger, Sato, Kimihiro, Zhang, Jing, Jung, Dong Ha, Wang, Xiaobin, Xu, Pengfa, Yen, Bing K.

“…Stackable 3D cross-point Spin transfer torque magnetic RAM (STT-MRAM) is one of the best candidates to replace DRAM and serve as storage class memory (SCM)…”
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Threshold switching selector and 1S1R integration development for 3D cross-point STT-MRAM by Hongxin Yang, Xiaojie Hao, Zihui Wang, Malmhall, Roger, Huadong Gan, Kimihiro Satoh, Jing Zhang, Dong Ha Jung, Xiaobin Wang, Yuchen Zhou, Yen, Bing K., Yiming Huai

“…To develop very high density STT-MRAM, 3D cross-point architecture is desirable, which requires a selector integrated with a pMTJ memory element. We present a…”
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Effect of humidity on friction and wear of AlSi eutectic alloy and AlSi alloy-graphite composites by Yen, B.K., Ishihara, T.

“…The influence of moisture content in air on the unlubricated sliding wear of an AlSi eutectic alloy and an AlSi alloy-graphite composite material containing…”
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Wear of ultrathin carbon overcoat characterized by microwear scan and Auger electron spectroscopy by Wu, Tsai-Wei, Deline, Vaughn, Scharf, Thomas W., Yen, Bing K., Barnard, John A.

“…A new methodology was developed to characterize the tribological performance of ultrathin carbon coatings by the microwear scan and Auger electron…”
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