Search Results - "Yao, Eric R."

Transmission scanning electron microscopy: Defect observations and image simulations by Callahan, Patrick G., Stinville, Jean-Charles, Yao, Eric R., Echlin, McLean P., Titus, Michael S., De Graef, Marc, Gianola, Daniel S., Pollock, Tresa M.

“…•The defect imaging capabilities of a FEG SEM equipped with a STEM detector were investigated.•Extended defects in a single crystal cobalt-base superalloy, a…”
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Dislocation dynamics in a nickel-based superalloy via in-situ transmission scanning electron microscopy by Stinville, J.C., Yao, Eric R., Callahan, Patrick G., Shin, Jungho, Wang, Fulin, Echlin, McLean P., Pollock, Tresa M., Gianola, Daniel S.

“…Micro-tensile specimens of nickel-based superalloy oligocrystals were tested in-situ in an scanning electron microscope in transmission mode (TSEM) enabling…”
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