Search Results - "Yan, Haihua"
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Application of inter‐professional care model in patients with aneurysmal subarachnoid haemorrhage
Published in Journal of nursing management (01-05-2020)“…Objective To explore the feasibility and effect of the inter‐professional care model in patients with aneurysmal subarachnoid haemorrhage. Methods A convenient…”
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Hierarchical Comprehensive Context Modeling for Chinese Text Classification
Published in IEEE access (2019)“…The Chinese text classification task is challenging compared to tasks based on other languages such as English due to the characteristics of the Chinese text…”
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Identification and robustness analysis of nonlinear hybrid dynamical system concerning glycerol transport mechanism
Published in Computers & chemical engineering (11-05-2012)“…► We develop a nonlinear hybrid dynamical system to describe the continuous culture. ► We quantitatively formulate parametric robustness to infer the transport…”
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Software testing evolution process model and growth of software testing quality
Published in Science China. Information sciences (01-03-2015)“…The paper is based on the research on a formal definition of software testing, with reference to organisms evolution's heredity/variation and adaptive dynamics…”
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An Approach of Conformance Verification between Design Models and Code Based on Abstract Syntax Tree
Published in MATEC Web of Conferences (01-01-2016)“…Design models and code are products of different stages in the software development process. The conformance of design models and code plays an important role…”
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Journal Article Conference Proceeding -
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Multimode Illinois Scan Architecture for Test Application Time and Test Data Volume Reduction
Published in 25th IEEE VLSI Test Symposium (VTS'07) (01-05-2007)“…The authors present a novel DFT technique based on multimode Illinois scan architecture (MILS) for low pin count test that simultaneously reduces test data…”
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A New Delay Test Based on Delay Defect Detection Within Slack Intervals (DDSI)
Published in IEEE transactions on very large scale integration (VLSI) systems (01-11-2006)“…This paper presents a new technique for detecting delay faults by observing the fault effects within slack intervals. Delay faults are detected through a…”
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A delay test to differentiate resistive interconnect faults from weak transistor defects
Published in 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design (2005)“…In deep submicron technology (DSM), many defects cause relatively small delay faults that are hard to detect, but can cause functional and/or reliability…”
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Conference Proceeding -
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Enhanced-condition-MC/DC: A method for improving MC/DC testing adequacy
Published in 2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS) (01-10-2016)“…The Modified Condition Decision Coverage (MC/DC) test criterion is a mandatory requirement for the testing of avionics software as per the DO-178B standard. In…”
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Conference Proceeding -
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Analysis of the influencing factors of abdominal Henoch-Schonlein purpura in children with gastrointestinal bleeding and the clinical value of PLR
Published in American journal of translational research (01-01-2024)“…To identify the influencing factors of gastrointestinal bleeding in children with abdominal-type Henoch-Schonlein purpura (HSP) and to assess the diagnostic…”
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Evaluating the effectiveness of detecting delay defects in the slack interval: a simulation study
Published in 2004 International Conferce on Test (2004)“…A new delay testing scheme that identifies abnormal delays in the slack interval by comparing switching delays in neighboring dies on a wafer has been recently…”
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Conference Proceeding -
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The research of testing process and data tracing based on hybrid model
Published in 2015 4th International Conference on Computer Science and Network Technology (ICCSNT) (01-12-2015)“…Software testing process is an important factor affecting the quality of software testing, which plays an important role in the entire software development…”
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Conference Proceeding -
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Requirement Modeling and Analysis Based on MDA
Published in 2012 International Conference on Control Engineering and Communication Technology (01-12-2012)“…Software development process based on MDA is driven by the behavior of the software system modeling, and UML which is one of the core standards defined by OMG…”
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Conference Proceeding -
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Event-Driven Fault Tolerance for Building Nonstop Active Message Programs
Published in 2013 IEEE 10th International Conference on High Performance Computing and Communications & 2013 IEEE International Conference on Embedded and Ubiquitous Computing (01-11-2013)“…With the decreasing Mean Time Between Failures (MTBF) of high performance computing systems, process failure has become a normal phenomenon rather than an…”
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Conference Proceeding -
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A Formal Definition of Software Testing Based on Fuzzy Measure
Published in 2013 Fourth World Congress on Software Engineering (01-12-2013)“…Software systems are faced with serious dependability crisis. It brings out a series of software dependability related research areas and the trusted software…”
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Conference Proceeding -
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Improvement on ABDOM-Qd and Its Application in Open-Source Community Software Defect Discovery Process
Published in 2013 Fourth World Congress on Software Engineering (01-12-2013)“…ABDOM-Q d is a model to describe the characteristics of software defect discovery time-ordered process, such as periodicity, attenuation, oscillation,…”
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Conference Proceeding -
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Reduce yield loss in delay defect detection in slack interval
Published in 13th Asian Test Symposium (2004)“…A new delay-testing scheme that identifies abnormal delays in the slack interval by comparing switching delays in neighboring dies on a wafer has been recently…”
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Conference Proceeding -
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Comparisons and analyses between RTCA DO-178B and GJB5000A, and integration of software process control
Published in 2010 3rd International Conference on Advanced Computer Theory and Engineering(ICACTE) (01-08-2010)“…The document RTCA DO-178B is the worldwide specification for avionics software process management. The document GJB5000A is the standard of Chinese domestic…”
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Conference Proceeding -
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Delay Defect Characterization Using Low Voltage Test
Published in 14th Asian Test Symposium (ATS'05) (2005)“…For nanometer designs, many subtle defects lead to excessive delays in signal paths that cause reliability concerns. Traditional test-based diagnosis methods…”
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Conference Proceeding