Search Results - "Yan, Haihua"

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  1. 1

    Application of inter‐professional care model in patients with aneurysmal subarachnoid haemorrhage by Xu, Juan, Wu, Jun, Yan, Haihua

    Published in Journal of nursing management (01-05-2020)
    “…Objective To explore the feasibility and effect of the inter‐professional care model in patients with aneurysmal subarachnoid haemorrhage. Methods A convenient…”
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    Journal Article
  2. 2

    Hierarchical Comprehensive Context Modeling for Chinese Text Classification by Liu, Jingang, Xia, Chunhe, Yan, Haihua, Xie, Zhipu, Sun, Jie

    Published in IEEE access (2019)
    “…The Chinese text classification task is challenging compared to tasks based on other languages such as English due to the characteristics of the Chinese text…”
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    Journal Article
  3. 3

    Identification and robustness analysis of nonlinear hybrid dynamical system concerning glycerol transport mechanism by Yan, Haihua, Zhang, Xu, Ye, Jianxiong, Feng, Enmin

    Published in Computers & chemical engineering (11-05-2012)
    “…► We develop a nonlinear hybrid dynamical system to describe the continuous culture. ► We quantitatively formulate parametric robustness to infer the transport…”
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    Journal Article
  4. 4

    Software testing evolution process model and growth of software testing quality by He, ZhiTao, Liu, Chao, Yan, HaiHua

    Published in Science China. Information sciences (01-03-2015)
    “…The paper is based on the research on a formal definition of software testing, with reference to organisms evolution's heredity/variation and adaptive dynamics…”
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    Journal Article
  5. 5

    An Approach of Conformance Verification between Design Models and Code Based on Abstract Syntax Tree by Liu, Zhao, Tian, Yang, Yan, Haihua

    Published in MATEC Web of Conferences (01-01-2016)
    “…Design models and code are products of different stages in the software development process. The conformance of design models and code plays an important role…”
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    Journal Article Conference Proceeding
  6. 6

    Multimode Illinois Scan Architecture for Test Application Time and Test Data Volume Reduction by Chandra, A., Haihua Yan, Kapur, R.

    Published in 25th IEEE VLSI Test Symposium (VTS'07) (01-05-2007)
    “…The authors present a novel DFT technique based on multimode Illinois scan architecture (MILS) for low pin count test that simultaneously reduces test data…”
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    Conference Proceeding
  7. 7

    A New Delay Test Based on Delay Defect Detection Within Slack Intervals (DDSI) by Haihua Yan, Singh, A.D.

    “…This paper presents a new technique for detecting delay faults by observing the fault effects within slack intervals. Delay faults are detected through a…”
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    Journal Article
  8. 8
  9. 9

    A delay test to differentiate resistive interconnect faults from weak transistor defects by Haihua Yan, Singh, A.D.

    “…In deep submicron technology (DSM), many defects cause relatively small delay faults that are hard to detect, but can cause functional and/or reliability…”
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    Conference Proceeding
  10. 10

    Enhanced-condition-MC/DC: A method for improving MC/DC testing adequacy by Haihua Yan, Xiaowei Zhang, Zhen Zhang

    “…The Modified Condition Decision Coverage (MC/DC) test criterion is a mandatory requirement for the testing of avionics software as per the DO-178B standard. In…”
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    Conference Proceeding
  11. 11

    Analysis of the influencing factors of abdominal Henoch-Schonlein purpura in children with gastrointestinal bleeding and the clinical value of PLR by Yang, Xiaoqing, Lu, Rong, Liu, Qing, Zhang, Jiangli, Yan, Haihua, Lu, Hairong

    Published in American journal of translational research (01-01-2024)
    “…To identify the influencing factors of gastrointestinal bleeding in children with abdominal-type Henoch-Schonlein purpura (HSP) and to assess the diagnostic…”
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    Journal Article
  12. 12

    Evaluating the effectiveness of detecting delay defects in the slack interval: a simulation study by Haihua Yan, Singh, A.D.

    “…A new delay testing scheme that identifies abnormal delays in the slack interval by comparing switching delays in neighboring dies on a wafer has been recently…”
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    Conference Proceeding
  13. 13

    The research of testing process and data tracing based on hybrid model by Xiaochen Liu, Haihua Yan, Yang Sun

    “…Software testing process is an important factor affecting the quality of software testing, which plays an important role in the entire software development…”
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    Conference Proceeding
  14. 14

    Requirement Modeling and Analysis Based on MDA by Hong Jin, Haihua Yan

    “…Software development process based on MDA is driven by the behavior of the software system modeling, and UML which is one of the core standards defined by OMG…”
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    Conference Proceeding
  15. 15

    Event-Driven Fault Tolerance for Building Nonstop Active Message Programs by Chao Li, Changhai Zhao, Haihua Yan, Jianlei Zhang

    “…With the decreasing Mean Time Between Failures (MTBF) of high performance computing systems, process failure has become a normal phenomenon rather than an…”
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    Conference Proceeding
  16. 16

    A Formal Definition of Software Testing Based on Fuzzy Measure by Zhitao He, Haihua Yan, Chao Liu, Huacan He

    “…Software systems are faced with serious dependability crisis. It brings out a series of software dependability related research areas and the trusted software…”
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    Conference Proceeding
  17. 17

    Improvement on ABDOM-Qd and Its Application in Open-Source Community Software Defect Discovery Process by Zhitao He, Haihua Yan, Chao Liu

    “…ABDOM-Q d is a model to describe the characteristics of software defect discovery time-ordered process, such as periodicity, attenuation, oscillation,…”
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    Conference Proceeding
  18. 18

    Reduce yield loss in delay defect detection in slack interval by Haihua Yan, Singh, A.D.

    Published in 13th Asian Test Symposium (2004)
    “…A new delay-testing scheme that identifies abnormal delays in the slack interval by comparing switching delays in neighboring dies on a wafer has been recently…”
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    Conference Proceeding
  19. 19

    Comparisons and analyses between RTCA DO-178B and GJB5000A, and integration of software process control by Jing Kong, Haihua Yan

    “…The document RTCA DO-178B is the worldwide specification for avionics software process management. The document GJB5000A is the standard of Chinese domestic…”
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    Conference Proceeding
  20. 20

    Delay Defect Characterization Using Low Voltage Test by Haihua Yan, Singh, A.D., Gefu Xu

    “…For nanometer designs, many subtle defects lead to excessive delays in signal paths that cause reliability concerns. Traditional test-based diagnosis methods…”
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    Conference Proceeding