Search Results - "Yamasue, Kohei"

Local carrier distribution imaging on few-layer MoS2 exfoliated on SiO2 by scanning nonlinear dielectric microscopy by Yamasue, Kohei, Cho, Yasuo

“…We demonstrate that scanning nonlinear dielectric microscopy (SNDM) can be used for the nanoscale characterization of dominant carrier distribution on…”
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Boxcar Averaging Scanning Nonlinear Dielectric Microscopy by Yamasue, Kohei, Cho, Yasuo

“…Scanning nonlinear dielectric microscopy (SNDM) is a near-field microwave-based scanning probe microscopy method with a wide variety of applications,…”
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Interfacial Charge States in Graphene on SiC Studied by Noncontact Scanning Nonlinear Dielectric Potentiometry by Yamasue, Kohei, Fukidome, Hirokazu, Funakubo, Kazutoshi, Suemitsu, Maki, Cho, Yasuo

“…We investigate pristine and hydrogen-intercalated graphene synthesized on a 4H-SiC(0001) substrate by using noncontact scanning nonlinear dielectric…”
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Atomic-dipole-moment induced local surface potential on Si(111)-(7 × 7) surface studied by non-contact scanning nonlinear dielectric microscopy by Yamasue, Kohei, Abe, Masayuki, Sugimoto, Yoshiaki, Cho, Yasuo

“…We have performed the site-specific, quantitative measurement of a local surface potential induced by atomic dipoles on a Si(111)-(7 × 7) surface by…”
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Atomic Resolution Studies on Surface Dipoles by Noncontact Scanning Nonlinear Dielectric Microscopy and Potentiometry by Yamasue, Kohei, Cho, Yasuo

“…Noncontact scanning nonlinear dielectric microscopy (NC-SNDM) is a microwave-based scanning probe microscopy method detecting the variation in the tip-sample…”
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Boxcar Averaging Based Scanning Nonlinear Dielectric Microscopy and Its Application to Carrier Distribution Imaging on 2D Semiconductors by Yamasue, Kohei, Cho, Yasuo

“…Intermittent contact scanning nonlinear dielectric microscopy (IC-SNDM) has recently been applied to the nanoscale carrier or active dopant distribution…”
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Improved study of electric dipoles on the Si(100)-2 × 1 surface by non-contact scanning nonlinear dielectric microscopy by Suzuki, Masataka, Yamasue, Kohei, Abe, Masayuki, Sugimoto, Yoshiaki, Cho, Yasuo

“…We studied a Si(100)-2 × 1 surface by non-contact scanning nonlinear dielectric microscopy (NC-SNDM). Simultaneously taken images of the topography and…”
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Experimental study of electric dipoles on an oxygen-adsorbed Si(100)-2 × 1 surface by non-contact scanning nonlinear dielectric microscopy by Suzuki, Masataka, Yamasue, Kohei, Cho, Yasuo

“…Oxygen-adsorption on a Si(100)-2 × 1 surface is investigated by using non-contact scanning nonlinear dielectric microscopy (NC-SNDM). On the Si(100)-2 × 1…”
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A Study on Evaluation of Interface Defect Density on High-K/SiO2/Si and SiO2/Si Gate Stacks using Scanning Nonlinear Dielectric Microscopy by Suzuki, Koharu, Yamasue, Kohei, Cho, Yasuo

“…We discuss the feasibility of interface defect density estimation using scanning nonlinear dielectric microscopy (SNDM). With reference to the previous results…”
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Atomic dipole moment distribution on a hydrogen-adsorbed Si(111)-(7 × 7) surface observed by noncontact scanning nonlinear dielectric microscopy by Mizuno, Daisuke, Yamasue, Kohei, Cho, Yasuo

“…Noncontact scanning nonlinear dielectric microscopy (NC-SNDM) can atomically resolve the polarization distribution on material surfaces. We observed a…”
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Controlling chaos in dynamic-mode atomic force microscope by Yamasue, Kohei, Kobayashi, Kei, Yamada, Hirofumi, Matsushige, Kazumi, Hikihara, Takashi

“…We successfully demonstrated the first experimental stabilization of irregular and non-periodic cantilever oscillation in the amplitude modulation atomic force…”
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Graphene on C-terminated face of 4H-SiC observed by noncontact scanning nonlinear dielectric potentiometry by Yamasue, Kohei, Fukidome, Hirokazu, Tashima, Keiichiro, Suemitsu, Maki, Cho, Yasuo

“…We studied graphene synthesized on the C-terminated face (C-face) of a 4H-SiC substrate by noncontact scanning nonlinear dielectric potentiometry. As already…”
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Observation of Polarization Distribution on Si(111) Surface by Scanning Nonlinear Dielectric Microscopy by Yamasue, Kohei, Cho, Yasuo

“…Noncontact scanning nonlinear dielectric microscopy (NC-SNDM) has the ability to simultaneously acquire the surface topography and polarization distribution at…”
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Observation of Polarization Distribution on Si(111) Surface by Scanning Nonlinear Dielectric Microscopy by Yamasue, Kohei, Cho, Yasuo

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Atomic Scale Imaging of TiO2(100) Reconstructed Surfaces by Noncontact Scanning Nonlinear Dielectric Microscopy by Sawai, Nobuhiro, Yamasue, Kohei, Cho, Yasuo

“…We performed noncontact scanning nonlinear dielectric microscopy (NC-SNDM) measurements to investigate both the topography and polarization distribution images…”
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Observation of Nanoscale Ferroelectric Domains Using Super-Higher-Order Nonlinear Dielectric Microscopy by Chinone, Norimichi, Yamasue, Kohei, Hiranaga, Yoshiomi, Cho, Yasuo

“…Scanning nonlinear dielectric microscopy is a powerful technique for measuring the domain structure of ferroelectrics. We observed congruent LiTaO 3 and found…”
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Observation of Nanoscale Ferroelectric Domains Using Super-Higher-Order Nonlinear Dielectric Microscopy by Chinone, Norimichi, Yamasue, Kohei, Hiranaga, Yoshiomi, Cho, Yasuo

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Local capacitance-voltage profiling and deep level transient spectroscopy of SiO2/SiC interfaces by scanning nonlinear dielectric microscopy by Yamasue, Kohei, Cho, Yasuo

“…We extend our local capacitance-voltage profiling method for the real-space nanoscale investigation of the SiO2/SiC interface, which is still an issue in the…”
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Local Capacitance-Voltage Profiling and Deep Level Transient Spectroscopy of SiO2/SiC Interfaces by Scanning Nonlinear Dielectric Microscopy by Yamasue, Kohei, Cho, Yasuo

“…In order to investigate the nanoscale spatial details of SiO 2 /SiC interfaces, we propose local capacitance-voltage and its voltage-derivative characteristics…”
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Nanoscale capacitance-voltage profiling of DC bias induced stress on a high-κ/SiO2/Si gate stack by Suzuki, Koharu, Yamasue, Kohei, Cho, Yasuo

“…We investigate DC bias stress effects on a HfOx/SiO2/p-Si gate stack using time-resolved scanning nonlinear dielectric microscopy. Our microscopy permits…”
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