Loss and the accuracy of the photonic crystal model in holey VCSELs

A comprehensive parametric study of VCSELs incorporating etched holes for lateral confinement was conducted. Results from over two thousand devices reveal the role of loss and verify the predictive abilities of the photonic crystal model.

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Bibliographic Details
Published in:(CLEO). Conference on Lasers and Electro-Optics, 2005 Vol. 3; pp. 1927 - 1928 Vol. 3
Main Authors: Danner, A.J., Raftery, J.J., Leisher, P.O., Yamaoka, E.A., Lala, S.R., Hwang, M.L., Choquette, K.D.
Format: Conference Proceeding
Language:English
Published: IEEE 2005
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Summary:A comprehensive parametric study of VCSELs incorporating etched holes for lateral confinement was conducted. Results from over two thousand devices reveal the role of loss and verify the predictive abilities of the photonic crystal model.
ISBN:1557527954
9781557527950
DOI:10.1109/CLEO.2005.202322