Search Results - "Yamada, W.E."
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Characteristics of GaAs heterojunction FETs (HFETs) and source follower FET logic (SFFL) inverters exoposed to high energy neutrons
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01-12-1989)“…This paper reports GaAs heterojunction field effect transistors (HFETs), and inverters and ring oscillators comprising HFETs exposed to neutron fluences of 5…”
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Conference Proceeding -
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Characteristics of GaAs buffered FET logic (BFL) MESFETs and inverters exposed to high-energy neutrons
Published in IEEE transactions on nuclear science (01-02-1991)“…A systematic investigation of the effects of high-energy neutrons on GaAs metal-semiconductor field-effect transistors (MESFETs) and buffered FET logic (BFL)…”
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Journal Article -
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Characteristics of GaAs heterojunction FETs (HFETs) and source follower FET logic (SFFL) inverters exposed to high energy neutrons
Published in IEEE transactions on nuclear science (01-12-1989)“…GaAs heterojunction field-effect transistors (HFETs) and inverters and ring oscillators comprising HFETs have been exposed to neutron fluences of 5*10/sup 13/…”
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Journal Article -
4
Characteristics of GaAs DCFL MESFET's and inverters exposed to high-energy neutrons
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01-12-1989)“…A systematic investigation of the effects of high-energy neutrons on GaAs metal-semiconductor field-effect transistors (MESFETs) and direct-coupled FET logic…”
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Journal Article Conference Proceeding -
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Characteristics of GaAs MESFET inverters exposed to high energy neutrons
Published in IEEE transactions on nuclear science (01-10-1988)“…GaAs MESFET circuits were exposed to high-energy neutrons with fluences ranging from 1*10/sup 14/ n/cm/sup 2/ to 2*10/sup 15/ n/cm/sup 2/. The reflections of…”
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Journal Article -
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Neutron radiation effects in GaAs junction field effect transistors
Published in IEEE transactions on nuclear science (01-12-1988)“…The effect of high-energy neutrons on GaAs junction field-effect transistors (JFETs) was investigated. The device threshold voltage, transconductance, and…”
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Journal Article