Space Shuttle Flight Test Results of the Cosmic Ray Upset Experiment

CRUX is the first engineering flight experiment designed to test for the incidence of upsets in microcircuits by energetic particles. Harris HM 6504 4K × 1 static CMOS RAM's were used as the test device types in a 1.3 megabit memory which flew on two shuttle flights. Ground (cyclotron) test inf...

Full description

Saved in:

Bibliographic Details
Published in:	IEEE transactions on nuclear science Vol. 31; no. 6; pp. 1178 - 1182
Main Authors:	Adolphsen, John W., Yagelowich, John J., Sahu, Kusum, Kolasinski, W. A., Koga, R., Stassinopoulos, E. G., Benton, Eugene V.
Format:	Journal Article
Language:	English
Published:	Legacy CDMS IEEE 01-12-1984
Subjects:	Aerospace engineering Cyclotrons Design engineering Error analysis Instrumentation And Photography NASA Predictive models Space shuttles Space technology Space vehicles Testing
Online Access:	Get full text
Tags:	Add Tag No Tags, Be the first to tag this record!

Description
Summary:	CRUX is the first engineering flight experiment designed to test for the incidence of upsets in microcircuits by energetic particles. Harris HM 6504 4K × 1 static CMOS RAM's were used as the test device types in a 1.3 megabit memory which flew on two shuttle flights. Ground (cyclotron) test information led to a prediction of about one error every 1000 days. No errors were experienced in 10 days of flight. While data were not in conflict with the error prediction and do support it, quantitative validation of the modeling for upsets is not statistically possible. Follow-on hardware (CRUX III) incorporates five different state-of-the-art microcircuits, and is scheduled for flight in October 1984.
Bibliography:	CDMS Legacy CDMS SourceType-Scholarly Journals-2 ObjectType-Feature-2 ObjectType-Conference Paper-1 content type line 23 SourceType-Conference Papers & Proceedings-1 ObjectType-Article-3
ISSN:	0018-9499 1558-1578
DOI:	10.1109/TNS.1984.4333478