Search Results - "Yadav, M.L."

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    Verification of the sputter-generated 32SFn− (n=1–6) anions by accelerator mass spectrometry by Mane, R.G., Surendran, P., Kumar, Sanjay, Nair, J.P., Yadav, M.L., Hemalatha, M., Thomas, R.G., Mahata, K., Kailas, S., Gupta, A.K.

    “…Recently, we have performed systematic Secondary Ion Mass Spectrometry (SIMS) measurements at our ion source test set up and have demonstrated that gas phase…”
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