Search Results - "YUAN, J.S"

First results of Ne shattered pellet injection for mitigating plasma disruption with full metal wall in EAST tokamak by Yuan, J.S., Zuo, G.Z., Zhao, S.B., Li, L., Zhuang, H.D., Zeng, L., Mao, S.T., Duan, Y.M., Chen, D.L., Xu, L.Q., Hou, J.L., Huang, M., Chen, Y., Hu, J.S.

“…Disruption mitigation poses a significant and unresolved challenge for ITER and future fusion reactor devices. To mitigate the effect of plasma disruption, a…”
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Effect of N2 on release behavior of D2 in liquid lithium by Li, L., Zhang, D.H., Meng, X.C., Yuan, J.S., Huang, M., Zuo, G.Z., Hu, J.S.

“…•Nitrogen in liquid lithium has a significant effect on the desorption temperature of hydrogen isotopes.•Chemical reactions and the formation of new D/N phases…”
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MOS RF reliability subject to dynamic voltage stress-modeling and analysis by Chuanzhao Yu, Yuan, J.S.

“…Dynamic stress on MOSFETs with 900-MHz inverter-like waveforms as well as static (or dc) stress were evaluated experimentally. It showed that the degradation…”
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CMOS RF Design for Reliability Using Adaptive Gate-Source Biasing by Yuan, J.S., Tang, H.

“…An adaptive gate-source biasing scheme to improve the MOSFET RF circuit reliability is presented. The adaptive method automatically adjusts the gate-source…”
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Electrical and Temperature Stress Effects on Class-AB Power Amplifier Performances by Chuanzhao Yu, Yuan, J.S.

“…Normalized degradations of drain efficiency and output power as a function of conduction angle, maximum drain current, and maximum output voltage are modeled…”
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Evaluation of RF-Stress Effect on Class-E MOS Power-Amplifier Efficiency by Yuan, J.S., Ma, J.

“…RF-stress effects on MOS power-amplifier performance are studied. The class-E power-amplifier power efficiency as a function of breakdown (BD) location has…”
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Hot-carrier and soft-breakdown effects on VCO performance by Enjun Xiao, Yuan, J.S., Hong Yang

“…This paper systematically investigates the hot-carrier- and soft-breakdown-induced performance degradation in a CMOS voltage-controlled oscillator (VCO) used…”
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RF circuit performance degradation due to soft breakdown and hot-carrier effect in deep-submicrometer CMOS technology by Qiang Li, Jinlong Zhang, Wei Li, Yuan, J.S., Yuan Chen, Oates, A.S.

“…A systematic study of RF circuit performance degradation subject to oxide soft breakdown (SBD), and hot-carrier (HC) stress is presented in this paper. DC and…”
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Teaching digital noise and noise margin issues in engineering education by Yuan, J.S., Li Yang

“…This work presents digital noise in signal integrity and clarifies noise margin issues in digital electronics education. For the static noise margin, the…”
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Calculation of the potential distribution of high voltage metal oxide arrester by using an improved semi-analytic finite element method by Han, S.J., Zou, J., Gu, S.Q., He, J.L., Yuan, J.S.

“…This paper proposes a semi-analytic finite element method to treat the open boundary axisymmetric electrostatic field problems. The method is applied to…”
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Optimization of NULL convention self-timed circuits by Smith, S.C., DeMara, R.F., Yuan, J.S., Ferguson, D, Lamb, D.

“…Self-timed logic design methods are developed using Threshold Combinational Reduction ( TCR) within the NULL Convention Logic (NCL) paradigm. NCL logic…”
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Low-power CMOS wireless MEMS motion sensor for physiological activity monitoring by Sadat, A., Hongwei Qu, Chuanzhao Yu, Yuan, J.S., Huikai Xie

“…In this paper, a short distance wireless sensor node "AccuMicroMotion" for physiological activity monitoring is proposed for detecting motions in six degrees…”
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Analysis of the toroidal HVDC grounding systems in horizontal multilayer soils by Zou, J., Liu, Y.Q., Yuan, J.S., He, J.L., Cao, L., Lee, J., Chang, S.

“…A Fredholm integral equation of the first kind has been developed for analyzing the performance of the toroidal high-voltage direct current (HVDC) grounding…”
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Teaching low-power electronic design in electrical and computer engineering by Yuan, J.S., Jia Di

“…Because of the continuous scaling of feature size and the increasing demand of mobile communication devices, power dissipation has become a major concern of…”
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Teaching asynchronous design in digital integrated circuits by Yuan, J.S., Weidong Kuang

“…To introduce the basis of asynchronous digital circuit design in an electrical engineering curriculum, Null Convention Logic is presented as an innovative…”
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Electromigration subjected to Joule heating under pulsed DC stress by Wu, W., Yuan, J.S., Kang, S.H., Oates, A.S.

“…This article reports an electromigration-lifetime model that incorporates the effect of Joule heating under pulsed DC condition. This median-time-to-failure…”
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Magnetic field analysis of iron-core reactor coils by the finite-volume method by Zou, J., Yuan, J.S., Ma, X.S., Cui, X., Chen, S.M., He, J.L.

“…An accurate evaluation of the magnetic field of the iron-core reactor coils by the finite-volume method (FVM) is presented. The linear and quadratic…”
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Design optimization of stacked layer dielectrics for minimum gate leakage currents by Zhang, J, Yuan, J.S, Ma, Y, Oates, A.S

“…An effective model to evaluate the leakage currents for different stacked gates deep submicron MOS transistors is presented. For a given equivalent oxide…”
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Non-target-site herbicide resistance: a family business by Yuan, Joshua S., Tranel, Patrick J., Stewart, C. Neal

“…We have witnessed a dramatic increase in the frequency and diversity of herbicide-resistant weed biotypes over the past two decades, which poses a threat to…”
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Process and temperature robust voltage multiplier design for RF energy harvesting by Yuan, J.S., Bi, Y.

“…•The threshold voltage compensation technique effectively reduces the temperature and process variability on the voltage multiplier performance.•The use of a…”
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