Search Results - "Xuanwu Kang"
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Development of UV light-emitting diodes based AlGaN/GaN heterojunction utilizing thermal oxidation annealing
Published in AIP advances (01-10-2024)“…Ultraviolet (UV) irradiation has a significant impact on enhancing the performance of sensors. Currently, there is still an urgent need for devices that are…”
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Ultrathin-Barrier AlGaN/GaN Heterostructure: A Recess-Free Technology for Manufacturing High-Performance GaN-on-Si Power Devices
Published in IEEE transactions on electron devices (01-01-2018)“…(Al)GaN recess-free normally OFF technology is developed for fabrication of high-yield lateral GaN-based power devices. The recess-free process is achieved by…”
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Design and fabrication of field-plated normally off β-Ga2O3 MOSFET with laminated-ferroelectric charge storage gate for high power application
Published in Applied physics letters (15-06-2020)“…In this work, an enhancement-mode (E-mode) β-Ga2O3 metal-oxide-semiconductor field-effect transistor (MOSFET) has been achieved by incorporating a…”
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High Uniformity Normally-OFF GaN MIS-HEMTs Fabricated on Ultra-Thin-Barrier AlGaN/GaN Heterostructure
Published in IEEE electron device letters (01-12-2016)“…Ultra-thin-barrier (UTB) AlGaN/GaN heterostructure is utilized for fabrication of normally-OFF GaN metal- insulator-semiconductor high-electron-mobility…”
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5
CMOS Process-Compatible High-Power Low-Leakage AlGaN/GaN MISHEMT on Silicon
Published in IEEE electron device letters (01-05-2012)“…We report on a novel Au-free CMOS process-compatible process for AlGaN/GaN metal-insulator-semiconductor high-electron-mobility transistors. The process starts…”
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Ultralow-Contact-Resistance Au-Free Ohmic Contacts With Low Annealing Temperature on AlGaN/GaN Heterostructures
Published in IEEE electron device letters (01-06-2018)“…We report on the electrical and microstructural characterization of Au-free Ti/Al/Ti/TiN contacts for AlGaN/GaN heterostructures. Ultra-low Au-free ohmic…”
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Time-Dependent Breakdown Mechanisms and Reliability Improvement in Edge Terminated AlGaN/GaN Schottky Diodes Under HTRB Tests
Published in IEEE electron device letters (01-03-2017)“…In this letter, we investigate the time-dependent breakdown mechanisms in edge terminated AlGaN/GaN lateral Schottky diodes under high-temperature reverse bias…”
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Optimization of Mesa Etch for a Quasi-Vertical GaN Schottky Barrier Diode (SBD) by Inductively Coupled Plasma (ICP) and Device Characteristics
Published in Nanomaterials (Basel, Switzerland) (01-04-2020)“…The optimization of mesa etch for a quasi-vertical gallium nitride (GaN) Schottky barrier diode (SBD) by inductively coupled plasma (ICP) etching was…”
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9
Facile integration of MoS2/SiC photodetector by direct chemical vapor deposition
Published in Nanophotonics (Berlin, Germany) (01-09-2020)“…The MoS photodetector on different substrates stacked via van der Waals force has been explored extensively because of its great potential in optoelectronics…”
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Investigation on Dynamic Characteristics of AlGaN/GaN Lateral Schottky Barrier Diode
Published in Micromachines (Basel) (22-10-2021)“…This work investigates the transient characteristics of an AlGaN/GaN lateral Schottky barrier diode (SBD) and its recovery process with a dedicated dynamic…”
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Investigation on Capacitance Collapse Induced by Secondary Capture of Acceptor Traps in AlGaN/GaN Lateral Schottky Barrier Diode
Published in Micromachines (Basel) (09-05-2022)“…In this study, a dedicated dynamic measurement system was used to investigate the transient capacitance and recovery process of AlGaN/GaN lateral Schottky…”
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Fabrication and Performance of Au-Free AlGaN/GaN-on-Silicon Power Devices With and / Gate Dielectrics
Published in IEEE transactions on electron devices (01-10-2013)“…Au-free GaN-based metal-insulator-semiconductor high electron-mobility transistors grown on 150-mm Si substrates are reported. The device characteristics for…”
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The impact of the gate dielectric quality in developing Au-free D-mode and E-mode recessed gate AlGaN/GaN transistors on a 200mm Si substrate
Published in 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01-05-2015)“…The selection of the gate dielectric is one of the most critical stability issues in recessed gate AlGaN/GaN transistors. In this work, we show that the…”
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Conference Proceeding -
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New source-side breakdown mechanism in AlGaN/GaN insulated-gate HEMTs
Published in 2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01-05-2013)“…We find that off-state breakdown in AlGaN/GaN insulated-gate HEMTs can occur at the source-side of the gate with increase in the drain voltage. This new…”
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Conference Proceeding -
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Investigation of current collapse mechanism of LPCVD Si3N4 passivated AlGaN/GaN HEMTs by fast soft-switched current-DLTS and CC-DLTFS
Published in 2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD) (01-05-2017)“…In this work, we investigated the current collapse mechanism of AlGaN/GaN high-electron mobility transistors (HEMTs) with LPCVD Si 3 N 4 passivation. With…”
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Conference Proceeding -
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Positive bias temperature instability evaluation in fully recessed gate GaN MIS-FETs
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01-04-2016)“…In this paper, positive bias temperature instability (PBTI) in fully recessed gate GaN MIS-FETs is studied by using an eMSM (extended Measure-Stress-Measure)…”
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Conference Proceeding -
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Combined plasma-enhanced-atomic-layer-deposition gate dielectric and in situ SiN cap layer for reduced threshold voltage shift and dynamic ON-resistance dispersion of AlGaN/GaN high electron mobility transistors on 200 mm Si substrates
Published in Japanese Journal of Applied Physics (01-04-2015)“…In this work we will present the experimental path followed to optimize the dynamic ON-resistance (RDS-ON) dispersion and to reduce the threshold voltage shift…”
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Journal Article -
18
Fast Recovery Performance and Design Method for High-Power Microwave Limiter Using GaN-SBD Technology
Published in IEEE transactions on microwave theory and techniques (01-08-2024)“…In this article, we report a major breakthrough in the recovery performance of microwave high-power limiters achieved through the utilization of gallium…”
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High temperature behaviour of GaN-on-Si high power MISHEMT devices
Published in 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC) (01-09-2012)“…The device performance of GaN-on-Si AlGaN/GaN MISHEMT devices with a Si 3 N 4 /Al 2 O 3 bi-layer gate dielectric is studied as a function of temperature. In…”
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Conference Proceeding -
20
High-Power Microwave Limiters Using Recess-Free AlGaN/GaN Schottky Barrier Diodes
Published in IEEE microwave and wireless technology letters (Print) (01-02-2023)“…In this letter, a thin-barrier AlGaN/GaN Schottky barrier diode (SBD) is proposed and implemented in a three-stage high-power RF limiter module. Benefited from…”
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