Search Results - "Woon, W.S."
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Characterization of anodic SiO2 films on P-type 4H-SiC
Published in Thin solid films (27-02-2009)Get full text
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Characterization of anodic SiO 2 films on P-type 4H-SiC
Published in Thin solid films (2009)“…The physical and electronic properties of 100–120-nm thick anodic silicon dioxide film grown on p-type 4H-SiC wafer and annealed at different temperatures…”
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Journal Article