Search Results - "Woelk, Egbert"

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  1. 1

    Performance of a central delivery system for metalorganic precursors by Woelk, Egbert

    Published in Journal of crystal growth (01-04-2010)
    “…Currently, the III-V compound semiconductor epi industry uses roughly 10,000 kg of TMGa per year. Virtually all of this TMGa is distributed in stainless-steel…”
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    Journal Article Conference Proceeding
  2. 2

    Antimony surfactant for epitaxial growth of SiGe buffer layers at high deposition temperatures by Storck, Peter, Vorderwestner, Martin, Kondratyev, Alexey, Talalaev, Roman, Amamchyan, Art, Woelk, Egbert

    Published in Thin solid films (2010)
    “…The effect of Sb on the growth behavior and the layer quality of graded SiGe buffer layers was studied at high-temperature CVD conditions. Sb was provided as…”
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    Journal Article Conference Proceeding
  3. 3

    Safer alternative liquid germanium precursors for relaxed graded SiGe layers and strained silicon by MOVPE by Shenai, Deo V., DiCarlo, Ronald L., Power, Michael B., Amamchyan, Artashes, Goyette, Randall J., Woelk, Egbert

    Published in Journal of crystal growth (2007)
    “…Commercial strategy to graded SiGe buffer layers and “strained silicon” involves passing germane (GeH 4) gas or germanium tetrachloride (GeCl 4) vapors as the…”
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    Journal Article Conference Proceeding
  4. 4

    Designing novel organogermanium OMVPE precursors for high-purity germanium films by Woelk, Egbert, Shenai-Khatkhate, Deodatta V., DiCarlo, Ronald L., Amamchyan, Artashes, Power, Michael B., Lamare, Bruno, Beaudoin, Grégoire, Sagnes, Isabelle

    Published in Journal of crystal growth (25-01-2006)
    “…Germanium and gallium arsenide have long been used in semiconductor structures and electronic devices. While organometallic vapor phase epitaxy (OMVPE) of…”
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    Journal Article Conference Proceeding
  5. 5

    Stable vapor transportation of solid sources in MOVPE of III–V compound semiconductors by Shenai-Khatkhate, Deodatta V., DiCarlo, Ronald L., Marsman, Charles J., Polcari, Robert F., Ware, Robert A., Woelk, Egbert

    Published in Journal of crystal growth (2007)
    “…Trimethylindium (TMI), in spite of being a solid, has remained the precursor of choice for the deposition of indium containing layers by MOVPE. However,…”
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    Journal Article Conference Proceeding
  6. 6

    Exceptionally stable vapor delivery of trimethylindium under intense OMVPE growth conditions by Shenai-Khatkhate, Deodatta V., Ware, Robert A., DiCarlo, Ronald L., Polcari, Robert F., Marsman, Charles J., Woelk, Egbert, Keiter, Alan G.

    Published in Journal of crystal growth (25-01-2006)
    “…Trimethylindium (TMI) is the preferred precursor for the deposition of indium containing layers by organo-metallic vapor phase epitaxy (OMVPE) because of its…”
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    Journal Article Conference Proceeding
  7. 7
  8. 8

    Measurement of low resistive ohmic contacts on semiconductors by Woelk, E.G., Krautle, H., Beneking, H.

    Published in IEEE transactions on electron devices (01-01-1986)
    “…Macroscopic analog models of planar contacts to semiconductor layers were made and equipotential lines underneath the contact were traced. Voltage drop and…”
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    Journal Article
  9. 9

    Contacts on GalnAs by Kraulte, H., Woelk, E., Selders, J., Beneking, H.

    Published in IEEE transactions on electron devices (01-06-1985)
    “…The specific contact resistance ρ c of Ni/Au-Ge/Ni and Ni/Au-Sn/Ni layers on n-GaInAs and Ni/Au-Mg/Ni and Ni/Au-Zu/Ni on p-GaInAs are measured for different…”
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    Journal Article