Search Results - "Windsor, Eric"

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  1. 1

    Chemical discrimination of multilayered paint cross sections for potential forensic applications using time‐of‐flight secondary ion mass spectrometry by Muramoto, Shin, Gillen, Greg, Windsor, Eric S.

    Published in Surface and interface analysis (01-09-2018)
    “…Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) equipped with a bismuth imaging source and an argon gas cluster ion beam (GCIB) was used to image…”
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    Journal Article
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    Preoperative spinopelvic hypermobility resolves following total hip arthroplasty by Sculco, Peter K, Windsor, Eric N, Jerabek, Seth A, Mayman, David J, Elbuluk, Ameer, Buckland, Aaron J, Vigdorchik, Jonathan M

    “…AimsSpinopelvic mobility plays an important role in functional acetabular component position following total hip arthroplasty (THA). The primary aim of this…”
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    Journal Article
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    Spinopelvic Hypermobility Corrects After Staged Bilateral Total Hip Arthroplasty by Windsor, Eric N., Sculco, Peter K., Mayman, David J., Vigdorchik, Jonathan M., Jerabek, Seth A.

    Published in HSS journal (01-11-2022)
    “…Background: Spinopelvic hypermobility may be secondary to a stiff osteoarthritic hip with a compliant spine. Purpose: We sought to determine if spinopelvic…”
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    Journal Article
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    The Use of Technology to Achieve the Functional Acetabular Safe Zone in Total Hip Arthroplasty by Windsor, Eric N., Sharma, Abhinav K., Premkumar, Ajay, Gkiatas, Ioannis, Sculco, Peter K., Vigdorchik, Jonathan M.

    Published in JBJS reviews (03-02-2022)
    “…Functional acetabular safe zones based on patient-specific factors during total hip arthroplasty are theorized to result in more optimal component stability…”
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    Journal Article
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    An Overview of Telehealth in Total Joint Arthroplasty by Windsor, Eric N., Sharma, Abhinav K., Gkiatas, Ioannis, Elbuluk, Ameer M., Sculco, Peter K., Vigdorchik, Jonathan M.

    Published in HSS journal (01-02-2021)
    “…With the increase in technological advances over the years, telehealth services in orthopedic surgery have gained in popularity, yet adoption among surgeons…”
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    Journal Article
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    Total knee arthroplasty in dialysis patients: Is it safe? A systematic review of the literature by Gkiatas, Ioannis, Xiang, William, Karasavvidis, Theofilos, Windsor, Eric N., Sharma, Abhinav K., Sculco, Peter K.

    Published in Journal of orthopaedics (01-05-2021)
    “…This systematic review characterizes the safety and efficacy of total knee arthroplasty (TKA) in end stage renal disease (ESRD) patients due to the unique…”
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    Journal Article
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    Abnormal spinopelvic mobility as a risk factor for acetabular placement error in total hip arthroplasty using optical computer-assisted surgical navigation system by Jang, Seong J, Vigdorchik, Jonathan M, Windsor, Eric W, Schwarzkopf, Ran, Mayman, David J, Sculco, Peter K

    Published in Bone & joint open (01-06-2022)
    “…Navigation devices are designed to improve a surgeon's accuracy in positioning the acetabular and femoral components in total hip arthroplasty (THA). The…”
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    Journal Article
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    Particle Fabrication Using Inkjet Printing onto Hydrophobic Surfaces for Optimization and Calibration of Trace Contraband Detection Sensors by Gillen, Greg, Najarro, Marcela, Wight, Scott, Walker, Marlon, Verkouteren, Jennifer, Windsor, Eric, Barr, Tim, Staymates, Matthew, Urbas, Aaron

    Published in Sensors (Basel, Switzerland) (24-11-2015)
    “…A method has been developed to fabricate patterned arrays of micrometer-sized monodisperse solid particles of ammonium nitrate on hydrophobic silicon surfaces…”
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    Journal Article
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    Assessing Pelvic Tilt in Patients Undergoing Total Hip Arthroplasty Using Sensor Technology by Sharma, Abhinav K., Vigdorchik, Jonathan M., Kolin, David A., Elbuluk, Ameer M., Windsor, Eric N., Jerabek, Seth A.

    Published in Arthroplasty today (01-02-2022)
    “…The purpose of our study was to assess the accuracy of a commercially available wearable sensor in replicating pelvic tilt movement in both the sitting and…”
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    Journal Article
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    Depth profiling using C60+ SIMS : Deposition and topography development during bombardment of silicon by GILLEN, Greg, BATTEAS, James, MICHAELS, Chris A, CHI, Peter, SMALL, John, WINDSOR, Eric, FAHEY, Albert, VERKOUTEREN, Jennifer, KIM, K. J

    Published in Applied surface science (30-07-2006)
    “…A C60+ primary ion source has been coupled to an ion microscope secondary ion mass spectrometry (SIMS) instrument to examine sputtering of silicon with an…”
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    Conference Proceeding Journal Article
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    Rapid Chemical Screening of Microplastics and Nanoplastics by Thermal Desorption and Pyrolysis Mass Spectrometry with Unsupervised Fuzzy Clustering by Forbes, Thomas P., Pettibone, John M., Windsor, Eric, Conny, Joseph M., Fletcher, Robert A.

    Published in Analytical chemistry (Washington) (22-08-2023)
    “…The transport and chemical identification of microplastics and nanoplastics (MNPs) are critical to the concerns over plastic accumulation in the environment…”
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    Journal Article
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    Application of Inkjet Printing Technology to Produce Test Materials of 1,3,5-Trinitro-1,3,5 Triazcyclohexane for Trace Explosive Analysis by Windsor, Eric, Najarro, Marcela, Bloom, Anna, Benner, Bruce, Fletcher, Robert, Lareau, Richard, Gillen, Greg

    Published in Analytical chemistry (Washington) (15-10-2010)
    “…The feasibility of the use of piezoelectric drop-on-demand inkjet printing to prepare test materials for trace explosive analysis is demonstrated. RDX…”
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    Journal Article
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    Copper Oxide Precipitates in NBS Standard Reference Material 482 by Windsor, Eric S, Carlton, Robert A, Gillen, Greg, Wight, Scott A, Bright, David S

    “…Copper oxide has been detected in the copper containing alloys of NBS Standard Reference Material (SRM) 482. This occurrence is significant because it…”
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    Journal Article
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    Depth profiling using C 60 + SIMS—Deposition and topography development during bombardment of silicon by Gillen, Greg, Batteas, James, Michaels, Chris A., Chi, Peter, Small, John, Windsor, Eric, Fahey, Albert, Verkouteren, Jennifer, Kim, K.J.

    Published in Applied surface science (30-07-2006)
    “…A C 60 + primary ion source has been coupled to an ion microscope secondary ion mass spectrometry (SIMS) instrument to examine sputtering of silicon with an…”
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    Journal Article