Search Results - "Winarski, R.P."

Electronic structures of the tungsten borides WB, W2B and W2B5 by Stadler, S., Winarski, R.P., MacLaren, J.M., Ederer, D.L., vanEk, J., Moewes, A., Grush, M.M., Callcott, T.A., Perera, R.C.C.

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Characterization of CNx films by X-ray emission measurements by Kurmaev, E.Z, Moewes, A, Winarski, R.P, Shamin, S.N, Ederer, D.L, Feng, J.Y, Turner, S.S

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Radiation-induced degradation of polyethersulphone films studied by fluorescent X-ray emission spectroscopy by Kurmaev, E.Z., Winarski, R.P., Endo, K., Ida, T., Moewes, A., Ederer, D.L., Pivin, J.-C., Shamin, S.N., Trofimova, V.A., Yarmoshenko, Yu.M.

“…The electronic structure and chemical bonding of unirradiated and irradiated Poly-1,4-phenylene-ether-sulphone (PES) films have been studied with fluorescent…”
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Soft X-ray fluorescence measurements of irradiated polymer films by Winarski, R.P., Ederer, D.L., Pivin, J.-C., Kurmaev, E.Z., Shamin, S.N., Moewes, A., Chang, G.S., Whang, C.N., Endo, K., Ida, T.

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Soft X-ray fluorescence measurements of irradiated polyimide and polycarbosilane films by Kurmaev, E.Z, Winarski, R.P, Ederer, D.L, Pivin, J.-C, Shamin, S.N, Moewes, A, Callcott, T.A, Chang, G.S, Whang, C.N

“…Fluorescent soft X-ray carbon Kα and silicon L 2,3 emission spectra (XES) have been used to characterize the bonding of carbon atoms in polyimide (PI) and…”
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Characterization of CN x films by X-ray emission measurements by Kurmaev, E.Z, Moewes, A, Winarski, R.P, Shamin, S.N, Ederer, D.L, Feng, J.Y, Turner, S.S

“…Carbon Kα and nitrogen Kα X-ray emission spectra (XES) excited by monochromatic synchrotron radiation have been used to characterize carbon nitride films (N/C…”
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Electronic structures of the tungsten borides WB, W 2B and W 2B 5 by Stadler, S., Winarski, R.P., MacLaren, J.M., Ederer, D.L., vanEk, J., Moewes, A., Grush, M.M., Callcott, T.A., Perera, R.C.C.

“…The electronic structures of the tungsten borides WB, W 2B and W 2B 5 were studied experimentally and theoretically. Using monochromatic synchrotron radiation…”
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Soft X-ray fluorescence measurements of polyimide films by Winarski, R.P., Ederer, D.L., Kurmaev, E.Z., Shamin, S.N., Endo, K., Ida, T., Moewes, A., Chang, G.S., Kim, S.Y., Whang, C.N.

“…Fluorescent X-ray emission spectroscopy has been used for the first time to study the electronic structure of polyimide films (PMDA-ODA) prepared on…”
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Chemical reactions in polymers induced by ion beam mixing: fluorescence X-ray measurements by Kurmaev, E.Z., Winarski, R.P., Pivin, J.-C., Ederer, D.L., Shamin, S.N., Moewes, A., Endo, K., Ida, T., Chang, G.S., Whang, C.N.

“…Fluorescent soft X-ray emission spectroscopy (XES) is used to study chemical reactions in polyimide (PI), polyethersulphone (PES) and polycarbosilane (PCS)…”
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The effects of boron impurities on the atomic bonding and electronic structure of Ni 3Al by Winarski, R.P, Eskildsen, T, Stadler, S, van Ek, J, Ederer, D.L, Kurmaev, E.Z, Grush, M.M, Callcott, T.A, Moewes, A, Lee, M

“…Tunable synchrotron radiation was used to examine the boron K-valence emission from boron doped Ni 3Al (500 parts per million boron). When compared with…”
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Soft X-ray scattering dominates emission near the giant resonance of the rare earth compounds by Moewes, A, Stadler, S, Winarski, R.P, Ederer, D.L, Callcott, T.A

“…Inelastic scattering of 4d electrons near the 4d–4f thresholds of Gd 2O 2S and Tm 2O 3 is studied with monochromatic synchrotron radiation excitation. The…”
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Study of 4f inner shell excitations in Gd and Tb using resonant inelastic soft X-ray scattering by Moewes, A., Winarski, R.P., Ederer, D.L., Grush, M.M., Callcott, T.A.

“…Inelastic scattering of 4d electrons near the 4d–4f threshold of Gd 2O 2S and Tb 4O 7 has been studied with monochromatic synchrotron radiation excitation. The…”
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The effects of boron impurities on the atomic bonding and electronic structure of Ni3Al by Winarski, R.P, Eskildsen, T, Stadler, S, van Ek, J, Ederer, D.L, Kurmaev, E.Z, Grush, M.M, Callcott, T.A, Moewes, A, Lee, M

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X-ray emission study of ion beam mixed Cu/Al films on polyimide by Kurmaev, E. Z., Zatsepin, D. A., Winarski, R. P., Stadler, S., Ederer, D. L., Moewes, A., Fedorenko, V. V., Shamin, S. N., Galakhov, V. R., Chang, G. S., Whang, C. N.

“…Cu (40 nm)/Al/polyimide/Si was mixed with 80 keV Ar + and N 2 + from 5.0 × 10 15 to 15 × 10 15 ions/cm 2 . Ultrasoft x-ray emission valence spectra (XES) of…”
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